ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
Detailed techniques for the construction of low (4–300 K) and high (300–700 K) temperature uniaxial stress application devices are described, designed for studying stress-induced effects, including ferroelastic (/ferroelectric) detwinning, induced phase transitions, piezo-optical effects in ferroic crystals under in situ optical control of their domain states by means of polarized light microscopy. Examples of the successful application of these systems to YBa2Cu3O7−δ , K3Fe5F15, and Cr3B7O13Cl crystals are presented and discussed. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145389
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