ISSN:
0951-4198
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The problem of artefact peaks, in spectra obtained from various tandem mass spectrometric scans on instruments of both forward and reverse geometry, is examined. The filtering conditions imposed by additional analyzers are investigated, in order to evaluate the potential of several different triple sector geometries to reduce specific interferences. No previous evaluation of the rejection ability for artefacts of different origins has been presented with respect to the various geometries. In order to gain a better insight into the origin of various artefacts, and to more easily explain their occurrence in certain geometries, a new graphical representation was developed in order to take into account the effects of three analyzer fields. This approach allows different linked scans to be projected within a cube, while also qualitatively proposing an explanation for the presence or absence of artefact peaks. New scans can also be conceived by means of this method, as is the case with a new selected mass ion kinetic energy (SMIKE) scan, which allows artefacts present in MIKE scans performed using reverse geometry instruments to be determined.
Additional Material:
15 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/rcm.1290090506
