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  • 1
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 9 (1995), S. 387-396 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The problem of artefact peaks, in spectra obtained from various tandem mass spectrometric scans on instruments of both forward and reverse geometry, is examined. The filtering conditions imposed by additional analyzers are investigated, in order to evaluate the potential of several different triple sector geometries to reduce specific interferences. No previous evaluation of the rejection ability for artefacts of different origins has been presented with respect to the various geometries. In order to gain a better insight into the origin of various artefacts, and to more easily explain their occurrence in certain geometries, a new graphical representation was developed in order to take into account the effects of three analyzer fields. This approach allows different linked scans to be projected within a cube, while also qualitatively proposing an explanation for the presence or absence of artefact peaks. New scans can also be conceived by means of this method, as is the case with a new selected mass ion kinetic energy (SMIKE) scan, which allows artefacts present in MIKE scans performed using reverse geometry instruments to be determined.
    Additional Material: 15 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 2
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 9 (1995), S. 1310-1314 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The possible presence of artefact peaks in mass-analyzed ion kinetic energy (MIKE) spectra has been recognized when such scans are performed using a two-sector instrument of reverse (BE) configuration. Since the presence of an artefact peak can be misleading when interpreting a spectrum, a new scan is proposed which allows these artefacts to be identified. This scan involves linking and scanning the two electrostatic sectors of an E1BE2 geometry instrument, while maintaining the magnet at the mass selected for the MIKE scan. This selected mass-analyzed ion kinetic energy (SMIKE) scan at E1=E2 results in a spectrum containing only artefact peaks that can be present in the corresponding MIKE spectrum.
    Additional Material: 10 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 3
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Rapid Communications in Mass Spectrometry 9 (1995), S. 888-894 
    ISSN: 0951-4198
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The advantages offered by the scanning facility of a multisector hybrid mass spectrometer of E1BE2qQ geometry, with software featuring an ‘experimental design’ function, are used to elucidate the origin of an artefact observed at m/z 290.8 in the linked scan spectrum at constant B/E of the m/z 299 ion of N,N-bissalicylidene 1,2-phenylenediamine, when performed using a forward geometry (EB) instrument. A previously proposed explanation, whereby the artefact peak was thought to originate from a fragmentation in the first field-free region, could not be verified by repeating the scan using an instrument of E1BE2qQ geometry, where E1 and E2 were linked during the scan at constant B/E. Several different scans were performed using an ‘experimental design’ scanning function, which allows analyzers to be scanned and linked by means of user-defined relationships. Thus, a mass-analysed ion kinetic energy (MIKE) (E2) scan, with E1 set to a value of 0.9725E0, revealed a peak at a value of 0.9462E0 which was subsequently determined to be due to an ion with a mass-to-charge ratio of 299, by using the quadrupole mass filter. A recently proposed graphical method, that allows the field values at which the artefact ion is transmitted to be plotted three dimensionally on a cube, illustrates that while the peak will appear in the spectrum obtained using a linked scan at constant B/E using an EB instrument, this will not be the case with an EBE geometry instrument. The EBE arrangement shows that the interference peak at m/z 290.8 appears to be the result of the transition of a higher-mass ion within the first electrostatic sector.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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