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  • Articles  (876)
  • 2010-2014  (876)
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  • Articles  (876)
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  • 1
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    In quest of perfection in electron optics-A biographical sketch of Harald Rose on the occasion of his 80th birthday (2014)
    Elsevier
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    Publication Date: 2014-12-26
    Description: Publication date: Available online 24 December 2014 Source: Ultramicroscopy Author(s): Knut W. Urban This brief biographical sketch of Harald Rose on occasion of his 80th birthday describes some of the key events in an extraordinarily successful scientific life. Many of the theoretical concepts developed by him over the last fifty years have been fundamental for electron optics. Indeed, some of them have changed the whole complexion of this field and are fundamental to modern electron microscopy, both in TEM and in STEM mode. With this dedicated issue of Ultramicroscopy, the members of the electron microscopy community would like to thank Harald Rose for dedicating his professional life to their field and thereby enriching the life of those active in it.
    Print ISSN: 0304-3991
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 2
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    Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates (2014)
    Elsevier
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    Publication Date: 2014-12-25
    Description: Publication date: Available online 23 December 2014 Source: Ultramicroscopy Author(s): W.O. Saxton This paper lists simple closed-form expressions estimating aberration coefficients (defocus, astigmatism, three-fold astigmatism, coma / misalignment, spherical aberration) on the basis of image shift or diffractogram shape measurements as a function of injected beam tilt. Simple estimators are given for a large number of injected tilt configurations, optimal in the sense of least-squares fitting of all the measurements, and so better than most reported previously. Standard errors are given for most, allowing different approaches to be compared. Special attention is given to the measurement of the spherical aberration, for which several simple procedures are given, and the effect of foreknowledge of this on other aberration estimates is noted. Details and optimal expressions are also given for a new and simple method of analysis, requiring measurements of the diffractogram mirror axis direction only, which are simpler to make than the focus and astigmatism measurements otherwise required.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 3
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    Towards a full retrieval of the deformation tensor F using Convergent Beam Electron Diffraction (2014)
    Elsevier
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    Publication Date: 2014-12-22
    Description: Publication date: Available online 19 December 2014 Source: Ultramicroscopy Author(s): Y. Martin , J.L. Rouvière , J.M. Zuo , V. Favre-Nicolin A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis Convergent Beam Electron Diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, 7 parameters out of the 9 parameters of F can be determined with an an accuracy of 3×10 −4 for the normal strain parameters ε xx , ε yy , ε zz , (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the 9 parameters of F can be determined by combining two directions of observation separated by about 20 degrees.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 4
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    Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): K.J. Coakley , A. Imtiaz , T.M. Wallis , J.C. Weber , S. Berweger , P. Kabos Near-field scanning microwave microscopy offers great potential to facilitate characterization, development and modeling of materials. By acquiring microwave images at multiple frequencies and amplitudes (along with the other modalities) one can study material and device physics at different lateral and depth scales. Images are typically noisy and contaminated by artifacts that can vary from scan line to scan line and planar-like trends due to sample tilt errors. Here, we level images based on an estimate of a smooth 2-d trend determined with a robust implementation of a local regression method. In this robust approach, features and outliers which are not due to the trend are automatically downweighted. We denoise images with the Adaptive Weights Smoothing method. This method smooths out additive noise while preserving edge-like features in images. We demonstrate the feasibility of our methods on topography images and microwave | S 11 | images. For one challenging test case, we demonstrate that our method outperforms alternative methods from the scanning probe microscopy data analysis software package Gwyddion. Our methods should be useful for massive image data sets where manual selection of landmarks or image subsets by a user is impractical.
    Print ISSN: 0304-3991
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 5
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    Quantitative investigation of SiGeC layers using atom probe tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier , Jean-Paul Barnes , Jean-Michel Hartmann , Didier Blavette The quantification of carbon and germanium in a Si/SiGeC multilayer structure using atom probe tomography has been investigated as a function of analysis conditions. The best conditions for quantitative results are obtained using an intermediate electric field and laser power. Carbon evaporation shows strong spatial and temporal correlation. By using multi-ion event analysis, an evaporation mechanism is put forward to explain the modification of mass spectra as a function of electric field and laser power.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 6
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    Transmission environmental scanning electron microscope with scintillation gaseous detection device (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Gerasimos Danilatos , Mary Kollia , Vassileios Dracopoulos A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole.
    Print ISSN: 0304-3991
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 7
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    Framed carbon nanostructures: Synthesis and applications in functional SPM tips (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: January 2015 Source: Ultramicroscopy, Volume 148 Author(s): I.S. Mukhin , I.V. Fadeev , M.V. Zhukov , V.G. Dubrovskii , A.O. Golubok We present a synthesis method to fabricate framed carbon-based nanostructures having highly anisotropic shapes, in particular, the nanofork and nanoscalpel structures which are obtained systematically under optimized growth conditions. A theoretical model is developed to explain the formation of such nanostructures on Si cantilevers and W etched wires exposed to a focused electron beam. We then demonstrate the potentials of these nanostructures as functional tips for scanning probe microscopy. Owing to their anisotropic shapes, such tips can be very useful for nanolithography, nanosurgery of biological objects, and precise manipulation with surface particles. Overall, our method provides a simple and robust way to produce functional scanning probe microscopy tips with variable shapes and enhanced capabilities for different applications compared to standard cantilevers.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 8
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    Multislice Algorithms Revisited: Solving the Schrödinger Equation Numerically for Imaging with Electrons (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: Available online 17 December 2014 Source: Ultramicroscopy Author(s): C. Wacker , R.R. Schröder For a long time, the high-energy approximation was sufficient for any image simulation in electron microscopy. This changed with the advent of aberration correctors that allow high-resolution imaging at low electron energies. To deal with this fact, we present a numerical solution of the exact Schrödinger equation that is novel in the field of electron microscopy. Furthermore, we investigate systematically the advantages and problems of several multislice algorithms, especially the real-space algorithms.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 9
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    High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator (2014)
    Elsevier
    Details
    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): M. Balantekin We present a high-speed operating method with feedback to be used in dynamic atomic force microscope (AFM) systems. In this method we do not use an actuator that has to be employed to move the tip or the sample as in conventional AFM setups. Instead, we utilize a Q -controlled eigenmode of an AFM cantilever to perform the function of the actuator. Simulations show that even with an ordinary tapping-mode cantilever, imaging speed can be increased by about 2 orders of magnitude compared to conventional dynamic AFM imaging.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 10
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    Chirality determination of quartz crystals using Electron Backscatter Diffraction (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): Aimo Winkelmann , Gert Nolze We demonstrate the determination of crystal chirality using electron backscatter diffraction (EBSD) in the scanning electron microscope. The chirality of α -quartz as a space-group-dependent property is verified via direct comparison of experimental diffraction features to simulations using the dynamical theory of electron diffraction.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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