Publication Date:
2014-12-22
Description:
Publication date: Available online 19 December 2014 Source: Ultramicroscopy Author(s): Y. Martin , J.L. Rouvière , J.M. Zuo , V. Favre-Nicolin A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis Convergent Beam Electron Diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, 7 parameters out of the 9 parameters of F can be determined with an an accuracy of 3×10 −4 for the normal strain parameters ε xx , ε yy , ε zz , (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the 9 parameters of F can be determined by combining two directions of observation separated by about 20 degrees.
Print ISSN:
0304-3991
Topics:
Electrical Engineering, Measurement and Control Technology
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Natural Sciences in General
,
Physics
