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  • Articles  (876)
  • 2010-2014  (876)
  • Ultramicroscopy  (876)
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  • 1
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    In quest of perfection in electron optics-A biographical sketch of Harald Rose on the occasion of his 80th birthday (2014)
    Elsevier
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    Publication Date: 2014-12-26
    Description: Publication date: Available online 24 December 2014 Source: Ultramicroscopy Author(s): Knut W. Urban This brief biographical sketch of Harald Rose on occasion of his 80th birthday describes some of the key events in an extraordinarily successful scientific life. Many of the theoretical concepts developed by him over the last fifty years have been fundamental for electron optics. Indeed, some of them have changed the whole complexion of this field and are fundamental to modern electron microscopy, both in TEM and in STEM mode. With this dedicated issue of Ultramicroscopy, the members of the electron microscopy community would like to thank Harald Rose for dedicating his professional life to their field and thereby enriching the life of those active in it.
    Print ISSN: 0304-3991
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 2
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    Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates (2014)
    Elsevier
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    Publication Date: 2014-12-25
    Description: Publication date: Available online 23 December 2014 Source: Ultramicroscopy Author(s): W.O. Saxton This paper lists simple closed-form expressions estimating aberration coefficients (defocus, astigmatism, three-fold astigmatism, coma / misalignment, spherical aberration) on the basis of image shift or diffractogram shape measurements as a function of injected beam tilt. Simple estimators are given for a large number of injected tilt configurations, optimal in the sense of least-squares fitting of all the measurements, and so better than most reported previously. Standard errors are given for most, allowing different approaches to be compared. Special attention is given to the measurement of the spherical aberration, for which several simple procedures are given, and the effect of foreknowledge of this on other aberration estimates is noted. Details and optimal expressions are also given for a new and simple method of analysis, requiring measurements of the diffractogram mirror axis direction only, which are simpler to make than the focus and astigmatism measurements otherwise required.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 3
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    Towards a full retrieval of the deformation tensor F using Convergent Beam Electron Diffraction (2014)
    Elsevier
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    Publication Date: 2014-12-22
    Description: Publication date: Available online 19 December 2014 Source: Ultramicroscopy Author(s): Y. Martin , J.L. Rouvière , J.M. Zuo , V. Favre-Nicolin A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis Convergent Beam Electron Diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, 7 parameters out of the 9 parameters of F can be determined with an an accuracy of 3×10 −4 for the normal strain parameters ε xx , ε yy , ε zz , (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the 9 parameters of F can be determined by combining two directions of observation separated by about 20 degrees.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 4
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    Quantitative investigation of SiGeC layers using atom probe tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier , Jean-Paul Barnes , Jean-Michel Hartmann , Didier Blavette The quantification of carbon and germanium in a Si/SiGeC multilayer structure using atom probe tomography has been investigated as a function of analysis conditions. The best conditions for quantitative results are obtained using an intermediate electric field and laser power. Carbon evaporation shows strong spatial and temporal correlation. By using multi-ion event analysis, an evaporation mechanism is put forward to explain the modification of mass spectra as a function of electric field and laser power.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 5
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    Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Matthieu Picher , Stefano Mazzucco , Steve Blankenship , Renu Sharma Here, we present a measurement platform for collecting multiple types of spectroscopy data during high-resolution environmental transmission electron microscopy observations of dynamic processes. Such coupled measurements are made possible by a broadband, high-efficiency, free-space optical system. The critical element of the system is a parabolic mirror, inserted using an independent hollow rod and placed below the sample holder which can focus a light on the sample and/or collect the optical response. We demonstrate the versatility of this optical setup by using it to combine in situ atomic-scale electron microscopy observations with Raman spectroscopy. The Raman data is also used to measure the local temperature of the observed sample area. Other applications include, but are not limited to: cathodo- and photoluminescence spectroscopy, and use of the laser as a local, high-rate heating source.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 6
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    Simultaneous orientation and thickness mapping in transmission electron microscopy (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Dmitry Tyutyunnikov , V. Burak Özdöl , Christoph T. Koch In this paper we introduce an approach for simultaneous thickness and orientation mapping of crystalline samples by means of transmission electron microscopy. We show that local thickness and orientation values can be extracted from experimental dark-field (DF) image data acquired at different specimen tilts. The method has been implemented to automatically acquire the necessary data and then map thickness and crystal orientation for a given region of interest. We have applied this technique to a specimen prepared from a commercial semiconductor device, containing multiple 22 nm technology transistor structures. The performance and limitations of our method are discussed and compared to those of other techniques available.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 7
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    Iterative reconstruction of magnetic induction using Lorentz transmission electron tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): C. Phatak , D. Gürsoy Intense ongoing research on complex nanomagnetic structures requires a fundamental understanding of the 3D magnetization and the stray fields around the nano-objects. 3D visualization of such fields offers the best way to achieve this. Lorentz transmission electron microscopy provides a suitable combination of high resolution and ability to quantitatively visualize the magnetization vectors using phase retrieval methods. In this paper, we present a formalism to represent the magnetic phase shift of electrons as a Radon transform of the magnetic induction of the sample. Using this formalism, we then present the application of common tomographic methods particularly the iterative methods, to reconstruct the 3D components of the vector field. We present an analysis of the effect of missing wedge and the limited angular sampling as well as reconstruction of complex 3D magnetization in a nanowire using simulations.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 8
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    Detecting and extracting clusters in atom probe data: A simple, automated method using Voronoi cells (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): P. Felfer , A.V. Ceguerra , S.P. Ringer , J.M. Cairney The analysis of the formation of clusters in solid solutions is one of the most common uses of atom probe tomography. Here, we present a method where we use the Voronoi tessellation of the solute atoms and its geometric dual, the Delaunay triangulation to test for spatial/chemical randomness of the solid solution as well as extracting the clusters themselves. We show how the parameters necessary for cluster extraction can be determined automatically, i.e. without user interaction, making it an ideal tool for the screening of datasets and the pre-filtering of structures for other spatial analysis techniques. Since the Voronoi volumes are closely related to atomic concentrations, the parameters resulting from this analysis can also be used for other concentration based methods such as iso-surfaces.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 9
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    Prospects of linear reconstruction in atomic resolution electron holographic tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Jonas Krehl , Axel Lubk Tomography commonly requires a linear relation between the measured signal and the underlying specimen property; for Electron Holographic Tomography this is given by the Phase Grating Approximation (PGA). While largely valid at medium resolution, discrepancies arise at high resolution imaging conditions. We set out to investigate the artefacts that are produced if the reconstruction still assumes the PGA even with an atomic resolution tilt series. To forego experimental difficulties the holographic tilt series was simulated. The reconstructed electric potential clearly shows peaks at the positions of the atoms. These peaks have characterisitic deformations, which can be traced back to the defocus a particular atom has in the holograms of the tilt series. Exchanging an atom for one of a different atomic number results in a significant change in the reconstructed potential that is well contained within the atom's peak.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 10
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    Modified Bethe formula for low-energy electron stopping power without fitting parameters (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): Hieu T. Nguyen-Truong We propose a modified Bethe formula for low-energy electron stopping power without fitting parameters for a wide range of elements and compounds. This formula maintains the generality of the Bethe formula and gives reasonable agreement in comparing the predicted stopping powers for 15 elements and 6 compounds with the experimental data and those calculated within dielectric theory including the exchange effect. Use of the stopping power obtained from this formula for hydrogen silsesquioxane in Monte Carlo simulation gives the energy deposition distribution in consistent with the experimental data.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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