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  • 2010-2014  (876)
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  • 1
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    In quest of perfection in electron optics-A biographical sketch of Harald Rose on the occasion of his 80th birthday (2014)
    Elsevier
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    Publication Date: 2014-12-26
    Description: Publication date: Available online 24 December 2014 Source: Ultramicroscopy Author(s): Knut W. Urban This brief biographical sketch of Harald Rose on occasion of his 80th birthday describes some of the key events in an extraordinarily successful scientific life. Many of the theoretical concepts developed by him over the last fifty years have been fundamental for electron optics. Indeed, some of them have changed the whole complexion of this field and are fundamental to modern electron microscopy, both in TEM and in STEM mode. With this dedicated issue of Ultramicroscopy, the members of the electron microscopy community would like to thank Harald Rose for dedicating his professional life to their field and thereby enriching the life of those active in it.
    Print ISSN: 0304-3991
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 2
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    Observation of lens aberrations for high resolution electron microscopy II: Simple expressions for optimal estimates (2014)
    Elsevier
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    Publication Date: 2014-12-25
    Description: Publication date: Available online 23 December 2014 Source: Ultramicroscopy Author(s): W.O. Saxton This paper lists simple closed-form expressions estimating aberration coefficients (defocus, astigmatism, three-fold astigmatism, coma / misalignment, spherical aberration) on the basis of image shift or diffractogram shape measurements as a function of injected beam tilt. Simple estimators are given for a large number of injected tilt configurations, optimal in the sense of least-squares fitting of all the measurements, and so better than most reported previously. Standard errors are given for most, allowing different approaches to be compared. Special attention is given to the measurement of the spherical aberration, for which several simple procedures are given, and the effect of foreknowledge of this on other aberration estimates is noted. Details and optimal expressions are also given for a new and simple method of analysis, requiring measurements of the diffractogram mirror axis direction only, which are simpler to make than the focus and astigmatism measurements otherwise required.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 3
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    Towards a full retrieval of the deformation tensor F using Convergent Beam Electron Diffraction (2014)
    Elsevier
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    Publication Date: 2014-12-22
    Description: Publication date: Available online 19 December 2014 Source: Ultramicroscopy Author(s): Y. Martin , J.L. Rouvière , J.M. Zuo , V. Favre-Nicolin A new method to retrieve the local lattice parameters and rotations in a crystal from off-axis Convergent Beam Electron Diffraction (CBED) patterns is presented and validated using Bloch wave dynamical simulations. The originality of the method is to use both the diffracted and transmitted beams and to use kinematical approximations in the fitting algorithm. The study is based on the deformation gradient tensor F which includes rotation and strain. Working on simulated images it is shown that (i) from a single direction of observation, 7 parameters out of the 9 parameters of F can be determined with an an accuracy of 3×10 −4 for the normal strain parameters ε xx , ε yy , ε zz , (ii) the unit cell volume can only be retrieved if the diffracted and transmitted beams are both included in the fitting and (iii) all the 9 parameters of F can be determined by combining two directions of observation separated by about 20 degrees.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 4
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    Quantitative investigation of SiGeC layers using atom probe tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): Robert Estivill , Adeline Grenier , Sébastien Duguay , François Vurpillot , Tanguy Terlier , Jean-Paul Barnes , Jean-Michel Hartmann , Didier Blavette The quantification of carbon and germanium in a Si/SiGeC multilayer structure using atom probe tomography has been investigated as a function of analysis conditions. The best conditions for quantitative results are obtained using an intermediate electric field and laser power. Carbon evaporation shows strong spatial and temporal correlation. By using multi-ion event analysis, an evaporation mechanism is put forward to explain the modification of mass spectra as a function of electric field and laser power.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 5
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    Iterative reconstruction of magnetic induction using Lorentz transmission electron tomography (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: March 2015 Source: Ultramicroscopy, Volume 150 Author(s): C. Phatak , D. Gürsoy Intense ongoing research on complex nanomagnetic structures requires a fundamental understanding of the 3D magnetization and the stray fields around the nano-objects. 3D visualization of such fields offers the best way to achieve this. Lorentz transmission electron microscopy provides a suitable combination of high resolution and ability to quantitatively visualize the magnetization vectors using phase retrieval methods. In this paper, we present a formalism to represent the magnetic phase shift of electrons as a Radon transform of the magnetic induction of the sample. Using this formalism, we then present the application of common tomographic methods particularly the iterative methods, to reconstruct the 3D components of the vector field. We present an analysis of the effect of missing wedge and the limited angular sampling as well as reconstruction of complex 3D magnetization in a nanowire using simulations.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 6
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    Spectrum imaging of complex nanostructures using DualEELS: I. digital extraction replicas (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): Joanna Bobynko , Ian MacLaren , Alan J. Craven This paper shows how it is possible to use Dual Electron Energy Loss Spectroscopy (DualEELS) to digitally extract spectrum images for one phase of interest in a complex nanostructured specimen. The specific cases studied here concern Nb or V precipitates, a few nanometres in size, in high manganese steels. The procedures outlined allow the extraction of the precipitate signal from the Fe–Mn matrix, as well as correction for surface oxide and any surface carbon contamination. The resulting precipitate-only spectrum images are then suitable for quantitative analysis of the precipitate chemistry. This procedure results in much improved background shapes under all edges of interest, mainly as a result of the removal of the extended electron loss fine structure (EXELFS) from the elements in the matrix. This allows the reliable extraction of even tiny quantities of elements, such as low levels of nitrogen in some carbide precipitates. As well as being relevant to precipitation in steels, these techniques will be widely applicable to the separation of chemically-distinct phases in complex nanostructured samples, and can be viewed as a digital version of the extraction replica technique.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 7
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    High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator (2014)
    Elsevier
    Details
    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): M. Balantekin We present a high-speed operating method with feedback to be used in dynamic atomic force microscope (AFM) systems. In this method we do not use an actuator that has to be employed to move the tip or the sample as in conventional AFM setups. Instead, we utilize a Q -controlled eigenmode of an AFM cantilever to perform the function of the actuator. Simulations show that even with an ordinary tapping-mode cantilever, imaging speed can be increased by about 2 orders of magnitude compared to conventional dynamic AFM imaging.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 8
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    Chirality determination of quartz crystals using Electron Backscatter Diffraction (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): Aimo Winkelmann , Gert Nolze We demonstrate the determination of crystal chirality using electron backscatter diffraction (EBSD) in the scanning electron microscope. The chirality of α -quartz as a space-group-dependent property is verified via direct comparison of experimental diffraction features to simulations using the dynamical theory of electron diffraction.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 9
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    Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: January 2015 Source: Ultramicroscopy, Volume 148 Author(s): M.D. Vaudin , W.A. Osborn , L.H. Friedman , J.M. Gorham , V. Vartanian , R.F. Cook Patterned SiGe thin film structures, heteroepitaxially deposited on Si substrates, are investigated as potential reference standards to establish the accuracy of high resolution electron backscattered diffraction (HR-EBSD) strain measurement methods. The proposed standards incorporate thin films of tetragonally distorted epitaxial Si 1− x Ge x adjacent to strain-free Si. Six films of three different nominal compositions ( x =0.2, 0.3, and 0.4) and various thicknesses were studied. Film composition and out-of-plane lattice spacing measurements, by x-ray photoelectron spectroscopy and x-ray diffraction, respectively, provided independent determinations of film epitaxy and predictions of tetragonal strain for direct comparison with HR-EBSD strain measurements. Films assessed to be coherent with the substrate exhibited tetragonal strain values measured by HR-EBSD identical to those predicted from the composition and x-ray diffraction measurements, within experimental relative uncertainties of order 2%. Such films thus provide suitable prototypes for designing a strain reference standard.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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  • 10
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    Modified Bethe formula for low-energy electron stopping power without fitting parameters (2014)
    Elsevier
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    Publication Date: 2014-12-19
    Description: Publication date: February 2015 Source: Ultramicroscopy, Volume 149 Author(s): Hieu T. Nguyen-Truong We propose a modified Bethe formula for low-energy electron stopping power without fitting parameters for a wide range of elements and compounds. This formula maintains the generality of the Bethe formula and gives reasonable agreement in comparing the predicted stopping powers for 15 elements and 6 compounds with the experimental data and those calculated within dielectric theory including the exchange effect. Use of the stopping power obtained from this formula for hydrogen silsesquioxane in Monte Carlo simulation gives the energy deposition distribution in consistent with the experimental data.
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    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
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