Note: Intro -- Supervisor's Foreword -- Parts of this thesis have been published in the following journal articles: -- Acknowledgements -- Contents -- 1 Introduction -- 1.1 Background and Significance -- 1.2 Thin Films Composed of Assembled Ordered Nanowire Arrays -- 1.2.1 Interface-Induced Nanowire Assembly -- 1.2.1.1 Assembly of Nanowires by the Langmuir-Blodgett Technique -- 1.2.1.2 Evaporation-Induced Assembly of Nanowires -- 1.2.1.3 Other Nanowire Assemblies at Complex Interfaces -- 1.2.2 Nanowire Assemblies by Mechanical Force -- 1.2.3 Nanowire Assemblies Induced by External Nanostructures -- 1.2.4 Assembly of 1D Nanostructures by External Fields -- 1.2.4.1 Magnetic Field-Assisted Assembly of 1D Nanostructures -- 1.2.4.2 Electric Field-Assisted Assembly of 1D Nanostructures -- 1.2.5 Nanowire Assemblies by Microfluidic Flow -- 1.2.6 Nanowire Assemblies by Bubble Blowing Process -- 1.2.7 Nanowire Assemblies by Electrospinning -- References -- 2 Synthesis of One-Dimensional Te Nanostructures -- 2.1 Introduction -- 2.2 Microwave-Assisted Synthesis of Te Nanowires -- 2.3 Solution-Based Synthesis of Te Nanostructure -- References -- 3 Interface-Induced Macroscopic Nanowire Assemblies -- 3.1 Introduction -- 3.2 Interface-Induced Assembly of One-Dimensional Nanomaterials -- 3.2.1 Langmuir-Blodgett Technology for Assembly of Nanowires -- 3.2.1.1 LB Assembly of UltraFine and UltraLong Te Nanowires -- 3.2.1.2 Ordered Ultrathin Telluride Nanowires and Hetero-nanowire Film -- 3.2.1.3 Co-assembly of Ag and Te Nanowires -- 3.2.1.4 LB Assembly of Ultrathin W18O49 Nanowires -- 3.2.2 Assembly of Nanowires at Liquid-Liquid Interface -- 3.2.3 Shear Force-Induced Assembly of Silver and Tellurium Nanowires -- References -- 4 Electron-Beam-Induced Nanowire Assemblies -- 4.1 Introduction -- 4.2 Fabrication of Carbon Films by In Situ Electron-Beam Irradiation. , 4.3 Fabrication of Carbon-Based Nanocomposites by In Situ Electron-Beam Irradiation -- 4.4 Conclusions -- References -- 5 Applications of the Nanowire Assemblies -- 5.1 Introduction -- 5.2 Fabrication of Nanowire Stamper -- 5.3 Nanowire Selective Transmission -- 5.4 Nanowire Photoconductors -- 5.5 Nanowire Memory Device -- 5.6 Ordered Nanowire Films for Electrochromic Devices -- 5.7 Nanowire Films for Surface-Enhanced Raman Substrates -- 5.8 Flexible Transparent Electrodes Based on the Nanowire Assemblies -- References.

Note: Front Cover -- Fluid Inclusion Effect in Flotation of Sulfide Minerals -- Fluid Inclusion Effect in Flotation of Sulfide Minerals -- Copyright -- Contents -- 1 - Mineral fluid inclusions -- 1.1 Definition of mineral fluid inclusions -- 1.2 Formation and mechanism of inclusions -- 1.2.1 Growth and defects of mineral crystals -- 1.2.2 Fluid capture by fluid inclusion -- 1.2.2.1 Irregular crystal growth -- 1.2.2.2 Unbalanced growth of various parts inside the crystal -- 1.2.2.3 Inclusion formation through differences in the medium concentration -- 1.2.2.4 Discontinuity of crystal growth -- 1.2.2.5 Effects of solid-phase substances and impurities -- 1.2.2.6 Influence of temperature and pressure -- 1.3 Changes in fluid inclusion after fluid capture -- 1.3.1 Phase changes -- 1.3.1.1 Crystallization on the body wall -- 1.3.1.2 Daughter minerals -- 1.3.1.3 Shrinkage and immiscibility -- 1.3.1.4 Metastability -- 1.3.2 Physical changes -- 1.3.2.1 Volume and shape changes -- 1.3.2.2 Fluid infiltration and loss -- 1.4 Inevitability and universality of fluid inclusions -- Further reading -- 2 - Classification of fluid inclusions -- 2.1 Genetic classification of inclusions -- 2.1.1 Primary inclusions -- 2.1.2 Pseudo-secondary inclusions -- 2.1.3 Secondary inclusions -- 2.1.4 Metamorphosed inclusions -- 2.2 Classification of physical phase states of inclusions -- 2.2.1 Fluid inclusions -- 2.2.1.1 Pure liquid inclusions -- 2.2.1.2 Pure gas inclusions -- 2.2.1.3 Liquid inclusions -- 2.2.1.4 Gas inclusions -- 2.2.1.5 Daughter mineral inclusions -- 2.2.1.6 Carbon dioxide inclusions including liquid -- 2.2.1.7 Oil-gas inclusions -- 2.2.2 Magmatic inclusions -- 2.2.2.1 Crystalline melt inclusions -- 2.2.2.2 Vitreous melt inclusions -- 2.2.2.3 Fluid melt inclusions -- References -- 3 - Methods for the detection and composition study of fluid inclusions. , 3.1 General optical microscopy research on fluid inclusions -- 3.1.1 Preparation of inclusion sheets -- 3.1.1.1 General requirements for the production of double-sided polished sheets -- 3.1.1.2 Grinding process of double-sided polished sheets -- 3.1.2 Identification of fluid inclusions -- 3.1.3 Morphology of fluid inclusions under the microscope -- 3.1.3.1 Shape -- 3.1.3.2 Size -- 3.1.3.3 Distribution -- 3.1.3.4 Abundance -- 3.1.3.5 Color -- 3.1.4 Phase state of matter in fluid inclusions -- 3.1.4.1 Gaseous phase -- 3.1.4.2 Liquid phase -- 3.1.4.3 Solid phase -- 3.1.4.4 Hydrocarbon -- 3.2 Modern research techniques for identifying fluid inclusions -- 3.2.1 Ultraviolet light microscopy -- 3.2.2 Infrared microscopy -- 3.2.3 Scanning electron microscopy -- 3.2.4 High-resolution X-ray computed tomography -- 3.3 Determination of inclusions' salinity -- 3.3.1 Basic principle of determining salinity of inclusions by the freezing method -- 3.3.2 Notes on the determination of salinity in inclusions by the freezing method -- 3.3.3 Instruments for measuring the freezing point -- 3.4 Extraction and analysis of fluid inclusion components -- 3.4.1 Issues to be aware of in composition analysis of inclusions -- 3.4.2 Analysis of chemical composition of group inclusions -- 3.4.2.1 Extraction of inclusion component fluids -- 3.4.2.1.1 Individual mineral selection -- 3.4.2.1.2 Cleaning -- 3.4.2.1.3 Opening of inclusions -- 3.4.2.1.3.1 Mechanical crushing method -- 3.4.2.1.3.2 Grinding method (for mineral processing) -- 3.4.2.1.3.3 Thermal explosion method -- 3.4.2.1.4 Treatment before determination of liquid-phase component of inclusions -- 3.4.2.2 Component analysis methods for liquid and gas in inclusions -- 3.4.2.2.1 Inductively coupled plasma mass spectrometry -- 3.4.2.2.2 Ion chromatography method -- 3.4.2.2.3 Gas chromatography. , 3.4.2.2.4 Quadrupole mass spectrometry -- 3.4.3 Analysis of the chemical composition of individual inclusions -- 3.4.3.1 Destructive analysis of individual fluid inclusions -- 3.4.3.1.1 Laser ablation inductively coupled plasma mass spectrometry -- 3.4.3.1.2 Scanning electron microscopy/energy-dispersive X-ray spectroscopy analysis -- 3.4.3.1.3 Secondary ion mass spectrometry analysis -- 3.4.3.2 Nondestructive analysis of individual fluid inclusions -- 3.4.3.2.1 Laser Raman spectroscopy -- 3.4.3.2.2 Fourier transform Infrared -- 3.4.3.2.3 Synchrotron radiation X-ray fluorescence -- 3.4.3.2.4 Microbeam proton-induced X/γ-ray analysis -- References -- Further reading -- 4 - Internal composition of mineral fluid inclusions -- 4.1 Gaseous-phase composition of inclusions -- 4.2 Liquid-phase components of inclusions -- 4.3 Solid-phase composition of inclusions -- 4.4 Metal components in fluid inclusions -- 4.4.1 Analysis and calculation of heavy metal elements in ore-forming fluids -- 4.4.1.1 Sample selection -- 4.4.1.2 Sample preparation -- 4.4.1.3 Sample test -- 4.4.1.4 Dilution multiples and concentration conversion -- 4.4.2 Metal components in fluid inclusions in Cu-Au mineral -- 4.4.3 Metal components in fluid inclusions of Pb-Zn mineral -- 4.4.4 Metal components of group inclusions in quartz and pyrite -- References -- Further reading -- 5 - Component release of fluid inclusions in sulfide mineral -- 5.1 Analysis of mineral raw materials -- 5.1.1 Chalcopyrite and associated minerals -- 5.1.2 Sphalerite and quartz -- 5.1.3 Galena -- 5.1.4 Pyrite -- 5.1.4.1 Pyrite and quartz vein samples from the pyrite deposits in Weixin, Yunnan -- 5.1.4.2 Pyrite and quartz vein samples of polymetallic sulfide deposits from the Dapingzhang area of Yunnan -- 5.2 Research methods for fluid inclusions in sulfide mineral. , 5.3 Morphology and component release of fluid inclusions in chalcopyrite -- 5.3.1 Infrared optical microscopic analysis of the fluid inclusions in chalcopyrite -- 5.3.2 SEM/EDS of the position of fluid inclusions in chalcopyrite -- 5.3.3 HRXMT analysis -- 5.3.4 Component release of the fluid inclusions in chalcopyrite -- 5.4 Component release of the fluid inclusions in associated minerals of chalcopyrite -- 5.4.1 Component release of the fluid inclusions in the associated quartz and calcite of chalcopyrite -- 5.4.2 Component release of fluid inclusions in chalcopyrite, sphalerite, and associated minerals -- 5.5 Morphology and component release of fluid inclusions in sphalerite and associated quartz -- 5.5.1 Morphology and types of fluid inclusions in sphalerite and associated quartz -- 5.5.2 Freezing point and salinity value of the fluid inclusions in sphalerite -- 5.5.3 SEM/EDS analysis of the fluid inclusions on sphalerite surface -- 5.5.4 Component release of fluid inclusions in sphalerite and quartz -- 5.6 Morphology and component release of fluid inclusions in galena -- 5.6.1 Infrared optics and SEM/EDS of fluid inclusions in galena -- 5.6.2 Component release of inclusions in galena -- 5.7 Morphology and component release of fluid inclusions in pyrite -- 5.7.1 Infrared optical microscopic analysis of fluid inclusions of pyrite in Weixin -- 5.7.2 SEM/EDS detection of the positions of inclusions in pyrite from Weixin -- 5.7.3 High-resolution X-ray topography of microfault pyrite from Weixin -- 5.7.4 Component release of the fluid inclusions of pyrite from Weixin -- 5.7.5 Component release of quartz fluid inclusion in the pyrite deposits of Weixin -- 5.7.6 Component release of fluid inclusions of pyrite from the polymetallic sulfide deposits of Dapingzhang. , 5.7.7 Component release of the fluid inclusions of quartz from polymetallic sulfide deposits of Dapingzhang -- Further reading -- 6 - Solubility of sulfide mineral and chemical behaviors of solution after release of inclusion components -- 6.1 Solubility of sulfide mineral -- 6.1.1 Research methods -- 6.1.2 Solubility of the chalcopyrite surface -- 6.1.3 Solubility of the sphalerite surface -- 6.1.4 Solubility of the pyrite surface -- 6.2 Equilibrium theory calculation of solubility of sulfide minerals -- 6.2.1 Solubility of sulfide mineral in pure water -- 6.2.2 Solubility of sulfide mineral at different pH -- 6.3 Chemical equilibrium calculation of metal ions in slurry solution -- 6.3.1 Cu2+ taring and component distribution -- 6.3.2 Zn2+ taring and component distribution -- 6.3.3 Pb2+ taring and component distribution -- References -- 7 - Interactions among components of fluid inclusions in sulfide mineral, mineral surfaces, and collectors -- 7.1 ζ potential measurement of the adsorption of released components of inclusions on mineral surfaces -- 7.1.1 Test method for ζ potential -- 7.1.2 Surface adsorption of inclusion components in chalcopyrite -- 7.1.3 Surface adsorption of inclusion components in sphalerite -- 7.1.4 Surface adsorption of inclusion components in pyrite and galena -- 7.2 Density functional theory of the interactions between the components of fluid inclusion colonies and mineral surfaces -- 7.2.1 Crystal model and calculation method -- 7.2.1.1 Chalcopyrite crystal model and calculation method -- 7.2.1.2 Sphalerite crystal model and calculation method -- 7.2.1.3 Pyrite crystal model and calculation method -- 7.2.2 Surface relaxation and reconstitution of sulfide mineral -- 7.2.2.1 Surface structure of chalcopyrite -- 7.2.2.2 Surface structure of sphalerite -- 7.2.2.3 Surface structure of pyrite. , 7.2.3 Interaction of chalcopyrite surface and the copper in inclusions.

Note: Intro -- Series preface -- Preface -- Acknowledgement -- Editor biography -- Jian Liu -- List of contributors -- Chapter 1 Research and application of reflective microscopy -- 1.1 Introduction -- 1.2 Current situation of research on reflective microscopy -- 1.3 The current situation of application of reflective microscopy -- 1.4 Summary -- References -- Chapter 2 Apodization factor and linearly polarized light focusing properties of elliptical mirror -- 2.1 Introduction -- 2.2 Elliptical mirror model -- 2.3 Apodization factor -- 2.4 Apodization factor under different parametric variables -- 2.4.1 Apodization factor in terms of z -- 2.4.2 Apodization factor in terms of θ -- 2.5 Focusing properties based on the vector theory -- 2.5.1 Vector theories -- 2.5.2 Three-dimensional expression of the focused electric field -- 2.5.3 Numerical simulation of the focusing field -- 2.6 Comparison of focusing properties among elliptical mirror, parabolic mirror and lens -- 2.7 Summary -- References -- Chapter 3 Focusing characteristic of polarized light -- 3.1 Basic model of an elliptical mirror -- 3.2 Vector focus model of elliptical mirror with extra high aperture angle -- 3.2.1 Analysis of focusing characteristic of elliptical mirror under circularly polarized illumination -- 3.2.2 Analysis of focusing characteristics of the elliptical mirror under radially polarized illumination -- 3.3 Conclusion -- References -- Chapter 4 Imaging analysis of dipole vector in an elliptical mirror -- 4.1 Introduction -- 4.2 Imaging model of dipole vector in elliptical mirror -- 4.3 Imaging characteristics of the electric dipole in the elliptical mirror -- 4.4 Imaging characteristics of the electric dipole in a dual-lens system -- 4.5 Comparison on imaging characteristics of dipole in elliptical mirror, parabolic mirror and lens -- 4.6 Summary -- References. , Chapter 5 Scalar approximation for the focusing property of an elliptical mirror -- 5.1 Introduction -- 5.2 Influence factors of focusing property -- 5.2.1 Apodization factor -- 5.2.2 Polarization state -- 5.2.3 Wave aberration -- 5.3 Apodization factor of elliptical mirror -- 5.3.1 Apodization factor of thin lens -- 5.3.2 Apodization factor of the elliptical mirror with rotational symmetry -- 5.4 Analysis on focusing property of elliptical mirror -- 5.4.1 Focusing property of elliptical mirror with circular aperture -- 5.4.2 Focusing property of elliptical mirror with ring-shaped aperture -- 5.5 Comparative analysis on vector diffraction model -- 5.6 Summary -- References -- Chapter 6 Aberration analysis of an elliptical mirror with a high numerical aperture -- 6.1 Introduction -- 6.2 Analysis of geometrical aberration of elliptical mirror -- 6.2.1 Reflected ray formula of elliptical mirror -- 6.2.2 Analysis of the aberration coefficient of a single rotating elliptical mirror -- 6.3 Diffraction integral in the presence of aberration -- 6.3.1 Debye diffraction integral in the presence of aberration -- 6.3.2 Strehl intensity -- 6.4 Zernike circle polynomial expansion of aberration function -- 6.4.1 Transference theorem -- 6.4.2 Zernike circle polynomial -- 6.5 Primary aberration and its influence on the focusing characteristic of the elliptical mirror -- 6.5.1 Primary spherical aberration -- 6.5.2 Primary coma -- 6.5.3 Primary astigmatism -- 6.5.4 Field curvature and distortion -- 6.5.5 Aberration tolerance of elliptical mirror -- 6.6 Conclusion -- References -- Chapter 7 Three-dimensional transfer function -- 7.1 Introduction -- 7.2 Point spread function -- 7.2.1 Coherent transfer function -- 7.2.2 Optical transfer function of elliptical mirror -- 7.3 Three-dimensional transfer function of an elliptical reflective confocal microscopic system. , 7.3.1 Coherent transfer function of elliptical reflective confocal microscopic system -- 7.3.2 Two-dimensional transfer function of the elliptical reflective confocal microscopic imaging system -- 7.4 Summary -- References -- Chapter 8 Design and application of an aspherical mirror -- 8.1 Introduction -- 8.2 Basic knowledge -- 8.2.1 Mathematical representation of aspherical surface -- 8.2.2 Taylor series -- 8.3 Design of reflective objective -- 8.3.1 Head design model -- 8.3.2 Aperture diaphragm and field diaphragm -- 8.4 Decoupled model based on the Taylor series expansion -- 8.4.1 Taylor series expansion of the Head polar coordinate model -- 8.4.2 Taylor series expansion of a quadric surface -- 8.4.3 Determination of reflective objective parameters -- 8.4.4 Derivation and truncation error of a high-order aspherical surface parameter -- 8.4.5 Effect of numerical aperture on a decoupled model -- 8.5 Design method based on an obscuration constraint -- 8.5.1 Analysis of the obscuration effect on a reflective objective -- 8.5.2 Obscuration constraint model -- 8.5.3 Design method based on obscuration constraint -- 8.6 Industrial application -- 8.6.1 Structural parameter calculation -- 8.6.2 Obscuration verification -- 8.6.3 Analysis of initial configuration imaging characteristics -- 8.6.4 Whole equipment and specific application -- 8.7 Summary -- References -- Chapter 9 Elliptical mirror applied in TIRF microscopy -- 9.1 Introduction -- 9.2 Background -- 9.3 Basic theory -- 9.4 Experiments -- 9.5 Summary -- References.

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Note: Intro -- Preface -- Acknowledgments -- Author biography -- Jian Liu -- Chapter 1 Confocal microscopy and its application in China -- 1.1 A brief review of confocal microscopy -- 1.2 Resolution -- 1.3 Standardization in China -- References -- Chapter 2 Point spread function model -- 2.1 Lens imaging -- 2.2 PSF in confocal imaging -- References -- Chapter 3 Incoherent three-dimensional optical transfer function -- 3.1 Development of 3D optical transfer function -- 3.2 3D imaging models of CM -- 3.3 3D-OTF of CM -- 3.4 3D-OTF of differential CM -- References -- Chapter 4 Decoupling criteria for three-dimensional optical microscopic measurement -- 4.1 Introduction -- 4.2 Decoupling model for the measurement of thin samples -- 4.3 Decoupling model for the measurement of a deep groove sample -- 4.4 Experiments -- References -- Chapter 5 Pupil filter design -- 5.1 Phase rotation transformation -- 5.2 The design method of filters with global minimizing side lobes -- References -- Chapter 6 Confocal axial peak extraction algorithm -- 6.1 Introduction -- 6.2 Centroid method for localization of confocal peak -- 6.3 Nonlinear fitting method for peak localization -- 6.4 Deviation analysis for localization of confocal axial peak -- References -- Chapter 7 Differential confocal microscopy -- 7.1 Introduction -- 7.2 Application of DCM in China -- 7.3 The Basic principle of DDCM -- References -- Chapter 8 Medium aided scattering measurement -- 8.1 Introduction -- 8.2 The principle of medium aided scattering confocal microscopy -- 8.3 Analysis of deposition uniformity of a fluorescent medium layer -- 8.4 Error analysis and height correction of the medium layer -- 8.5 Application of medium aided scattering confocal microscopy -- References -- Chapter 9 Scanning technology -- 9.1 Introduction -- 9.2 Scanners -- 9.3 Raster scanning -- 9.4 α-β circular scanning. , References -- Chapter 10 Confocal profilometer -- 10.1 Introduction -- 10.2 Basic principle -- 10.3 The extraction method of discrete surface -- 10.3.1 Method of planar substrate conversion -- 10.3.2 Method of polynomial regression -- 10.4 Application of confocal profilometer -- References.