ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
We synthesized spinel ZnAl2O4 film on α-Al2O3 substrate using a solid-phase reaction between the pulsed-laser-deposited ZnO film and α-Al2O3 substrate. Auger electron spectroscopy showed that the atomic distribution in the spinel ZnAl2O4 was inhomogeneous, which indicated that the reaction was diffusion controlled. Based on X-ray fluorescence measurements, the apparent growth activation energy of ZnAl2O4 was determined as 504 kJ/mol. X-ray diffractometry spectra showed that, as the growth temperature increased, the ZnAl2O4 film became disoriented from the single (111) orientation. The ZnAl2O4 (333) diffraction peak shifted toward a small angle, and its full-width at half-maximum decreased from 1.30° to 0.37°. At the growth temperature of 1100°C, the morphology of the ZnAl2O4 was initially transformed from islands to stick structures, then to bulgy-line structures with increased growth time. X-ray diffractometry spectra showed that these transformations were correlated with changes of ZnAl2O4 orientation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.2003.tb03609.x
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