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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigated the influence of the presence of oxygen during the deposition of the calcium cathode on the structure and on the performance of polymeric light emitting diodes (pLEDs). The oxygen background pressure during deposition of the calcium cathode of polymeric LEDs was varied. Subsequently, the oxygen depth distribution was measured and correlated with the performance of the pLEDs. The devices have been fabricated in a recently built ultraclean setup. The polymer layers of the pLEDs have been spincoated in a dry nitrogen atmosphere and transported directly into an ultrahigh vacuum chamber where the metal electrodes have been deposited by evaporation. We used indium–tin–oxide as anode, OC1C10 PPV as electroluminescent polymer, calcium as cathode, and aluminum as protecting layer. We achieved reproducibility of about 15% in current and brightness for devices fabricated in an oxygen atmosphere of (very-much-less-than)10−9 mbar. For further investigations the calcium deposition was carried out in an oxygen atmosphere from 10−8 to 10−5 mbar. We determined the amount of oxygen in the different layers of the current–voltage-light characterized pLEDs with elastic recoil detection analysis and correlated it with the characteristics of the devices. The external efficiency of the pLEDs decreases continuously with increasing oxygen pressure, the current shows a pronounced minimum. The brightness mostly decreases with increasing oxygen with an indication of a slight minimum. PLEDs with completely oxidized calcium are not operational. The first contact of the pLEDs with the dry glove box environment leads to an immediate reduction of current and brightness which is caused by the cooling of the devices by several degrees. Determining reproducible characteristics of pLEDs in the vacuum requires the measurement of their temperature. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 1058-1064 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In the study of interfacial diffusion processes in polymer light-emitting diodes, the use of high-energy ion-scattering techniques can be of great value due to the possibility of quantitative elemental depth profiling. However, ion irradiation of polymers is known to cause various degradation effects, including the loss of hydrogen. Since the hydrogen loss determines the accuracy of depth profiling, it is an interesting subject for study in order to define experimental conditions in which the degradation is suppressed. The loss of hydrogen from porphyrins (organic solar cells) has been measured by means of elastic recoil detection analysis with 2, 4, and 7.6 MeV He+ beams. A theoretical model is proposed in which the hydrogen loss is described through the formation and recombination of free hydrogen radicals. A distinct difference is introduced between direct recombination processes and the diffusion of radicals out of the ion track. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2255-2257 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A cause for degradation of polymer light-emitting diodes is the oxidation of the polymer by oxygen diffusing out of the indium-tin-oxide (ITO) anode. This problem can be solved by the introduction of an organic hole-injecting film, poly-(3,4-ethylenedioxythiophene) (PEDOT) doped with poly(styrenesulfonate) (PSS), between the ITO and the emissive polymer. Indeed, a dramatic improvement of the lifetime and also the luminous efficiency has been observed. However, our Rutherford backscattering (RBS) studies show that the ITO/PEDOT:PSS interface is not stable. In as prepared glass/ITO/PEDOT:PSS samples 0.02 at. % indium was found in the PEDOT:PSS film. Annealing in a nitrogen atmosphere at 100 °C during 2500 h increased the indium concentration to 0.2 at. %. Upon exposure to air much faster degradation of the ITO/PEDOT:PSS interface was observed; after several days in air the amount of indium reached a saturation concentration of 1.2 at. %. The degradation of the interface can be explained by etching of the ITO due to the strong acidic nature of PEDOT:PSS. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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