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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1761-1766 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new apparatus for magneto-optical investigations of high temperature superconducting (HTS) films as large as 20×20 cm2 is presented. With this equipment flux penetration of an external magnetic field into YBCO thin films has been studied by scanning the samples through an inhomogeneous magnetic field (magneto-optical scanning technique, MOST). The normal penetration of magnetic flux into a superconductor will be changed drastically in the presence of defects. The apparatus was constructed to realize an effective quality control of large area HTS thin films used for device fabrication. With this technique, a visualization of flux pattern in superconducting films larger than 1×1 cm2 is presented for the first time. The results are compared to inductive jc measurements as well as to micrographs [optical microscope (OM), scanning electron microscopy (SEM)] and show that also in the large area characterization the magneto-optical method is very sensitive to microstructural defects impairing the critical current density, which is the relevant parameter for an application of the superconducting thin films. Moreover, it could be shown that MOST has appreciable advantages compared to inductive jc scans and microscopy (OM, SEM). In particular it is possible to observe defects, which are below the optical resolution of the MOST setup. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 474-476 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A special patented design is built up to produce homogeneous YBa2Cu3O7−x (YBCO) films by pulsed laser deposition (PLD) over areas as large as 7×20 cm2. The use of a line focus (8 cm) reduces the substrate movement to one dimension. The demands on plasma homogenization, substrate scanning and film temperature during the deposition process for large area PLD are discussed and their technical realization is presented. First results of 1×1 cm2 YBCO films at different positions on the substrate holder (11×28 cm2) show homogeneous deposition conditions. The transition temperatures of the deposited YBCO thin films on 1×1 cm2 SrTiO3 substrates are TC=89 K with critical currents of 4×106 A/cm2 at T=77 K. The structural properties of these films (χmin=4.5%) indicate also their high crystalline quality. The variation of film thickness perpendicular to the scanning direction is less than ±9% and along the scanning direction ±7%. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0921-4534
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 69 (1999), S. S419 
    ISSN: 1432-0630
    Keywords: PACS: 74.60.Jg; 74.72.Bk; 74.76.Bz
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract. YBCO thin films and buffer layers are deposited by a special PLD setup with an 8-cm line focus on cylindrical targets and substrate scanning perpendicular to it. Different kinds of substrates (SrTiO3, MgO, LaAlO3, Y-ZrO2and sapphire) as large as 7×20 cm2 were coated with YBCO. Two important aspects of the presented PLD setup will be discussed in detail: the method of substrate heating and the variation of the angle between the incident laser beam and the target surface (“wobbling”). The surface of the target material has been investigated by SEM. The influence of target “wobbling” on the time stability of the plasma will be discussed. The homogeneity of the deposited YBCO films with respect to structural and electrical properties has been investigated by XRD, RBS/channeling, and spatially resolved inductive measurements of Tc and jc. The values of jc on 7×20 cm2in situ buffered sapphire substrates are 2.0 MA/cm2 at (77 K, 0 T) with a jc variation of less than ±20%.
    Type of Medium: Electronic Resource
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