Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
80 (1996), S. 459-463
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Both optical transmission spectroscopy and photothermal deflection spectroscopy are used to determine the spectra of C70 thin films over a wide energy range (0.6–6.5 eV). Based on a molecular orbital model, the optical transitions for the C70 thin film are analyzed. The weak absorption spectra of C70 thin films are similar to that of an amorphous semiconductor. The optical energy gap is derived by a Tauc plot as 1.66 eV. The gap region can be described in terms used for amorphous semiconductors, having features such as an Urbach edge and subgap defect absorption, which are interpreted as a broadening due to disorder or impurities. The effects of the deflection medium on the weak absorption spectra of C70 films are discussed. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.362747
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