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  • 1
    Book
    Book
    The role of sea ice thermodynamics in the Northern Hemisphere climate as simulated by a global coupled ocean-atmosphere model (2001)
    Details Availability
    Type of Medium: Book
    Pages: 22 S , graph. Darst
    Series Statement: Notes du Pole de Modelisation 21
    Language: English
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  • 2
    Online Resource
    Online Resource
    Integrierte nahfeldoptische Sensoren : Forschungsbericht/Abschlußbericht (2001)
    Ulm : Univ.
    Details Availability
    Keywords: Forschungsbericht
    Type of Medium: Online Resource
    Pages: Online Ressource, 29 p. = 2,65 MB, text and images , ill., graph
    Edition: [Electronic ed.]
    URL: https://edocs.tib.eu/files/e01fb01/331715430.pdf
    URL: https://edocs.tib.eu/files/e01fb01/331715430l.pdf
    Language: German
    Note: Contract BMBF 13N7040. - nIndex. - Differences between the printed and electronic version of the document are possible , Also available as printed version , Systemvoraussetzungen: Acrobat Reader.
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  • 3
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    Revised age models and foraminiferal records obtained for the Last Interglacial period in six marine sediment cores (2012)
    PANGAEA
    In:  Supplement to: Govin, Aline; Braconnot, Pascale; Capron, Emilie; Cortijo, Elsa; Duplessy, Jean-Claude; Jansen, Eystein; Labeyrie, Laurent D; Landais, Amaëlle; Marti, O; Michel, Elisabeth; Mosquet, E; Risebrobakken, Bjørg; Swingedouw, Didier; Waelbroeck, Claire (2012): Persistent influence of ice sheet melting on high northern latitude climate during the early Last Interglacial. Climate of the Past, 8, 483-507, https://doi.org/10.5194/cp-8-483-2012
    Details
    Publication Date: 2024-03-02
    Description: The dataset contains the revised age models and foraminiferal records obtained for the Last Interglacial period in six marine sediment cores: - the Southern Ocean core MD02-2488 (age model, sea surface temperatures, benthic d18O and d13C for the period 136-108 ka), - the North Atlantic core MD95-2042 (age model, planktic d18O, benthic d18O and d13C for the period 135-110 ka), - the North Atlantic core ODP 980 (age model, planktic d18O, sea surface temperatures, seawater d18O, benthic d18O and d13C, ice-rafted detritus for the period 135-110 ka), - the North Atlantic core CH69-K09 (age model, planktic d18O, sea surface temperatures, seawater d18O, benthic d18O and d13C, ice-rafted detritus for the period 135-110 ka), - the Norwegian Sea core MD95-2010 (age model, percentage of Neogloboquadrina pachyderma sinistral, sea surface temperatures, benthic d18O, ice-rafted detritus for the period 134-110 ka), - the Labrador Sea core EW9302-JPC2 (age model, percentage of Neogloboquadrina pachyderma sinistral, sea surface temperatures, benthic d18O for the period 134-110 ka).
    Keywords: 162-980; CALYPSO; Calypso Corer; Center for Marine Environmental Sciences; CH69-K09; COMPCORE; Composite Core; EW9302-JPC2; GC; Giant piston corer (Calypso); GPC-C; Gravity corer; IMAGES I; Joides Resolution; JPC; Jumbo Piston Core; Kerguelen Plateau; Labrador Sea; Last Interglacial; Leg162; Marge Ibérique; Marion Dufresne (1995); MARUM; MD02-2488; MD101; MD125; MD 125 / SWIFT BIS-CARHOT; MD952010; MD95-2010; MD952042; MD95-2042; Newfoundland margin; Norwegian Sea; Ocean Drilling Program; ODP; South Atlantic Ocean; Southern Ocean; Voring Plateau
    Type: Dataset
    Format: application/zip, 12 datasets
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  • 4
    Electronic Resource
    Electronic Resource
    Spectrally resolved near-field mode imaging of vertical cavity semiconductor lasers (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 3831-3834 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The transversal mode properties of vertical cavity surface emitting lasers (VCSELs) are studied by spectrally resolved scanning near-field optical microscopy. In contrast to classical optical microscopy techniques, our method is able to simultaneously decompose lasing transversal modes by their wavelength with lateral superresolution. As the tip-sample distance is controlled by the well-established shear-force detection, additional topographical information showing the surface structure of the laser is provided. Therefore, near-field spectroscopy allows the detailed analysis of the spatial light distribution emitted by the laser with respect to the current injection contact, making it a promising tool for the characterization and optimization of VCSELs. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361810
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  • 5
    Electronic Resource
    Electronic Resource
    Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 4178-4182 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We show that the use of fiber overtone resonance modes up to 3 MHz for shear-force distance control has two advantages for near-field microscopy. The higher dither frequency allows a shorter feedback loop time delay, which in turn allows scanning speeds of 100 μm/s on a sample with, for example, a 150 nm height variation over a 1 μm distance. Experiments on a hard semiconductor device and on a soft polymer sample demonstrate a factor of 5 improvement in scanning speed when the dither frequency is increased by a factor of 20. The second advantage is a reduction of the minimum lateral force required for height regulation, which is important for soft samples. Modeling the piezoelectric detection system as a harmonic oscillator indicates a factor of 33 increase in lateral force sensitivity when using the third overtone resonance of a typical fiber tip. This result is confirmed experimentally by immersing the tip into water. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1406922
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  • 6
    Electronic Resource
    Electronic Resource
    Concurrent measurement of adhesive and elastic surface properties with a new modulation technique for scanning force microscopy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 2765-2771 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The combination of two well-established dynamic scanning force microscopy (SFM) modes is incorporated for SFM in combined dynamic X mode or CODY Mode® SFM. A vertical modulation of low frequency and large amplitude is superimposed with a second vertical modulation of high frequency and low amplitude leading to a combination of pulsed force mode SFM, force modulation, and phase sensitive SFM. SFM in the new mode allows the simultaneous mapping of a number of physical surface properties including adhesive force and elasticity over one scan. The new SFM technique is nondestructive and alteration or even destruction of the sample surface is reduced to a minimum. A polymer blend (two homopolymers spin coated on silicon from a tetrahydrofuorane solution of a mixture of poly-2-vinylpyridin and polytertbutylmethacrylate) was used as a sample for comparative measurements between pulsed force mode, force modulation mode and the new SFM mode. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150689
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  • 7
    Electronic Resource
    Electronic Resource
    Distance control in near-field optical microscopy with piezoelectrical shear-force detection suitable for imaging in liquids (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1769-1772 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We introduce an improved piezoelectric shear-force feedback system for tip-sample distance control in a scanning near-field optical microscope. A tapered glass fiber is glued into a metal tube and both are integrated in a mounting, sandwiched between two piezosegments. One of the piezoelements excites the fiber tip at mechanical resonance while the other one is used for detection. During surface approach the fiber resonance is damped by shear forces, which is registered by the second piezoelement and used for distance control. The main attractions of this setup are its simplicity, its compactness, and the lack of disturbing light sources. The fiber is easy accessible and tip exchange is simple. With an acceptable fiber amplitude of 5–10 nm (peak to peak) we obtained a topographical resolution of 5 pm/Hz. The geometry also allows the measurement of samples covered with a few millimeters of liquid, which is important for applications in biology and medicine. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147990
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  • 8
    Electronic Resource
    Electronic Resource
    Lock-in technique for concurrent measurement of adhesion and friction with the scanning force microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 150-156 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Regardless of all the great progress in new scanning probe microscopy techniques, the concurrent measurement of adhesive and frictional forces with local resolution using scanning force microscopy (SFM) has not been possible until now. In this paper, we present a novel scanning probe microscopy mode, called combined dynamic x mode or CODYMode®. In CODYMode® SFM at least two oscillations with sufficiently different frequencies and amplitudes are superimposed and interact with the sample surface. This enables the concurrent measurement of the topography, adhesive and frictional forces beside further mechanical surface properties of the sample. By means of the characterization of plasma treated biaxially oriented polypropylene foils the benefits of the new modulation technique are pointed out where common SFM techniques are not adequate. As second application high-velocity friction experiments (in the range of several centimeters per second) on silicon under controlled environmental conditions are introduced and the role of the native water film on it is discussed under friction and viscoelastic aspects. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1329898
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  • 9
    Electronic Resource
    Electronic Resource
    Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3118-3122 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new two-step method to fabricate scanning near-field optical microscope (SNOM) probes with an aperture size clearly below 100 nm has been developed. For the first step, a chemical etching process is used in which an optical fiber is dipped with its acrylate jacket into hydrofluoric acid to get a suitable tapered shape of the fiber. The second step consists of beveling the etched fiber using a modified micropipette beveler to obtain a tip diameter in the nanometer range as well as a smooth surface to allow a good aluminum metallization by evaporation. By varying the beveling angle tapered shapes with different cone angles can be obtained. First transmission experiments with our probes show an optical resolution below 80 nm. In comparison to fiber tips obtained by a standard heating and pulling method, the transmission efficiency of these tips is up to three orders of magnitude higher due to the optimized tapered shape. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1304866
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  • 10
    Electronic Resource
    Electronic Resource
    Modulated shear–force distance control in near-field scanning optical microscopy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 1466-1471 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The tip–sample distance in near-field scanning optical microscopy is typically controlled by the shear–force interaction between the laterally vibrating tip and sample. In this article, a mode of shear-force feedback is described in which an additional vertical modulation is introduced. Similar to the tapping mode applied in atomic force microscopy, the modulated shear–force technique deals with problem due to the snap to contact and therefore improves the mapping of soft and ductile materials, such as biological samples and soft polymers. The imaging properties of the modulated shear–force mode is demonstrated on structures of a soft polymer blend. Additionally, the modulated shear–force technique allows a simple comparison between effects in the optical far field and in the optical near field. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150481
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