In:
ECS Transactions, The Electrochemical Society, Vol. 25, No. 2 ( 2009-09-25), p. 1263-1272
Abstract:
Damage modeling can be used as a highly useful and cost effective tool to support the product development process. Models, referring to physics and chemistry of damage, generate a robust basis for reliability and lifetime assessment. They deliver reliable relationships between load and damage kinetics, which is used to evaluate damage kinetics under various operation conditions and boundaries. Simplified damage models, based on the relationship between operation conditions and damage kinetics can be used already during early phases of product development, when component load data measurements are not yet available. Thus, relevant input for decision making can be generated already within the concept phase. Throughout the development process accuracy rises step-by-step with the quality of available probes and data. This analysis method is in particular useful for decision making in situations with a limited amount of information. This paper describes the physics of failure approach to support SOFC development ranging from concept to validation. It describes the approach and lines out some typical failure modes. Further it describes typical applications to support component layout, test design, validation planning and failure assessment.
Type of Medium:
Online Resource
ISSN:
1938-5862
,
1938-6737
Language:
Unknown
Publisher:
The Electrochemical Society
Publication Date:
2009
Permalink