Keywords:
Electron microscopy.
;
Nanoelectronics.
;
Electronic books.
Description / Table of Contents:
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Type of Medium:
Online Resource
Pages:
1 online resource (189 pages)
Edition:
1st ed.
ISBN:
9781461421917
Series Statement:
Nanostructure Science and Technology Series
URL:
https://ebookcentral.proquest.com/lib/geomar/detail.action?docID=971514
DDC:
502.825
Language:
English
Note:
Intro -- Modeling Nanoscale Imagingin Electron Microscopy -- Preface -- Contents -- Kantianism at the Nano-scale -- 1 Introduction -- 2 Nano-Images: Seeing the Invisible? -- 3 The Epistemic Significance of Observability -- 4 A Neo-Kantian Understanding of Science -- 5 Nano-Images -- References -- The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems -- 1 Introduction -- 2 Z-Contrast Imaging in STEM -- 2.1 Basic Concepts of Z-contrast Imaging -- 2.2 Aberration Correction -- 2.3 Low-dose Imaging -- 3 Application to Nanoscale Systems -- 3.1 The Structure of Clathrates -- 3.2 Nitrogen Doping in GaAs -- 3.3 Structure/Composition Fluctuations at Dislocations in SrTiO3 -- 3.4 Size Distribution in Catalytic Nanoparticles -- 4 Conclusions -- References -- High Resolution Exit Wave Restoration -- 1 Introduction -- 2 The Wave Aberration Function -- 3 Partial Coherence -- 3.1 Coherence Envelopes -- 3.2 Beyond Envelope Functions -- 4 Linear and Non-Linear Imaging -- 5 Specimen Approximations -- 5.1 The Phase Object Approximation -- 5.2 The Phase Contrast Transfer Function -- 6 Aberration Measurement -- 6.1 Minimum Variance -- 6.2 Tilt-Induced Aberration Measurement -- 6.2.1 Tilt-Induced Image Displacements -- 6.2.2 Tilt-Induced Defocus and Astigmatism -- 6.2.3 Automated Diffractogram Fitting -- 6.3 Aberration Determination from Crystalline Materials -- 7 Restoration Filters -- 7.1 The Paraboloid Method -- 7.2 Improved Linear Restoration Filters -- 7.3 The Maximum Likelihood Method -- 7.4 Transport of Intensities -- 7.5 Exit Wave Restoration Using Aberration Corrected Images -- 7.6 Alternative Experimental Data Sets -- 8 Conclusions -- References -- Compressed Sensing and Electron Microscopy -- 1 Introduction -- 2 The Foundations of Compressed Sensing -- 2.1 Models Classes for Images -- 2.2 Sampling.
,
2.3 Decoding in Compressed Sensing -- 2.4 Dealing with Noise -- 2.5 Summary -- 3 What Could Compressed Sensing Buy for Electron Microscopy? -- 3.1 High-Resolution 2D Images: Model Class 1 -- 3.1.1 Image Model and Data Acquisition -- 3.1.2 Sparsity for Model Class 1 -- 3.1.3 Measurements for Model Class 1 -- 3.1.4 Inversion and Sparse Recovery Techniques -- 3.2 Electron Tomography -- 3.2.1 Example 1 -- 3.2.2 Example 2 -- 3.2.3 Logan-Shepp-Type Phantom -- 4 Conclusions -- References -- High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF-STEM) -- 1 Introduction -- 2 STEM Imaging -- 3 Formation of High-Quality Images from Low-Resolution/Noisy Images -- 4 Nonlocal Means Algorithms for Sequences of Micrographs -- 4.1 Nonlocal Means for Time Series -- 4.2 A Multistage Algorithm -- 4.2.1 The First Stage: Single Frame Denoising -- 4.2.2 The Second Stage: Registration of Denoised Frames -- 4.2.3 The Third Stage: Multiframe Image Formation-Averaging -- 4.3 M1 Catalyst Micrograph Formation -- 5 Zeolite Micrograph Formation -- 6 Conclusion -- References -- Center of Mass Operators for Cryo-EM-Theory and Implementation -- 1 Introduction -- 2 Problem Setup -- 3 The GCAR Algorithm -- 3.1 Problem's Discretization -- 3.2 Orientations Revealing Operator -- 3.3 Orientation Encoding Eigenvectors -- 3.4 Coordinates Unmixing -- 3.5 Examples -- 4 Orientations Refinement -- 5 Center Estimation -- 5.1 Shift Equations -- 5.2 Detecting Common Lines -- 5.3 Measuring the Shift Estimation Error -- 5.4 Examples -- 6 Reconstruction from Real Data -- 7 Summary and Outlook -- References -- Index.
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