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  • 1
    Electronic Resource
    Electronic Resource
    Soft x-ray magneto-optical Kerr effect (invited) (abstract) : 38th Annual Conference on Magnetism and Magnetic Materials (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 5810-5810 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recently, there has been a great deal of interest in x-ray magnetic circular dichroism (MCD) and its applications to the study of magnetic thin films and multilayers due to the dramatically enhanced dichroic effect and its element specific nature. In this work, the soft x-ray magneto-optical Kerr effect, an effect closely related to MCD, is investigated. Detailed comparison between MCD and the Kerr effect is discussed. As an example, recent results from a thin bcc Co film will be presented. In the Kerr effect measurement, specular reflectivity as a function of incident angle and photon energy was measured using both linearly polarized and circularly polarized x rays. To give the largest effect, in the case of linearly polarized light, specular reflectivity was measured in the transverse configuration, while in the case of circularly polarized light, the measurement was carried out in the longitudinal configuration. In both cases very large changes in reflectivity, up to 40% in the linearly polarized case and 75% in the circularly polarized case, were observed near the Co LII and LIII absorption edges upon reversal of the direction of the magnetic field. These results agree very well with a macroscopic model calculation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.355575
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  • 2
    Electronic Resource
    Electronic Resource
    X-ray transmission through a plasma window (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 1677-1679 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Traditional solid window materials used for x-ray synchrotron beamlines may introduce undesirably high attenuation, or are subject to failure under high heat loads. A plasma window can in principle obviate these problems over a wide range of energies. Experiments were performed at the Brookhaven National Laboratory National Synchrotron Light Source on beamline X6A to study the transmission characteristics of a plasma window using argon as the arc gas. Measurements were made around the Ar K edge and far from resonance. The "white-line" absorption at the K edge was actually suppressed during arc operation as compared to room temperature gas at the same pressure. This is attributed to the high degree of ionization in the plasma. The relative strength of the white line to the edge jump does not seem to be a strong function of arc current at the argon K edge. Away from resonance (∼3 times the edge energy) x-ray attenuation was negligible. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1344598
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  • 3
    Electronic Resource
    Electronic Resource
    X-ray resonant magnetic scattering ellipsometer : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3363-3364 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: It is very difficult to characterize the polarization of a synchrotron radiation source in the soft and/or intermediate x-ray energy region particularly from 1 to 2 keV. Conventional multilayer mirror or single-crystal polarimeters do not work over this energy region because their throughput (the reflectivities combined with the phase shift) becomes insignificant. In this paper, we present a new ellipsometer scheme that is able to fully characterize the polarization of synchrotron radiation sources in this energy region. It is based on the dichroic x-ray resonant ferromagnetic scattering that yields information on both the polarization of the x-ray and the material (element specific) dielectric-constant tensor [C.-C. Kao et al., Phys. Rev. B 50, 9599 (1994)] due to the interband ferromagnetic Kerr effect [B.R. Cooper, Phys. Rev. A 139, 1504 (1965)]. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147472
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  • 4
    Electronic Resource
    Electronic Resource
    X13A: A versatile soft x-ray undulator beamline : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1827-1829 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The undulator based beamline X13A at the National Synchrotron Light Source has been commissioned recently. The X13 undulator has an 8 cm period, and its first harmonic is in the energy range of 200–700 eV at the nominal ring energy of 2.5 GeV. The beamline uses horizontally deflecting optics. It consists of a SiC plane mirror, a water cooled entrance slit, a spherical grating, and two fixed exit slits. A flux of more than 1012 photons/s at 450 eV has been measured at X13A with an aluminum-oxide photodiode with a 200 μm entrance slit, a 500 μm exit slit, and a ring current of 242 mA. A VF3 absorption spectrum recorded at X13A shows the monochromator resolving power is at least 1000 at ∼500 eV with 30 μm entrance and exit slits, in agreement with calculations. The X13A beamline will be used for x-ray coherence studies, spectroscopy, and multilayer reflectivity measurements as well as for x-ray instrumentation diagnostics. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146461
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  • 5
    Electronic Resource
    Electronic Resource
    High resolution time-of-flight analysis of photon stimulated ion desorption from chemically treated silicon surfaces (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 4156-4160 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The native oxide, thermally oxidized and hydrofluoric acid rinsed surfaces of Si(100) have been characterized by photon stimulated ion desorption (PSD), and both photoelectron and Auger electron spectroscopies. The only species detected by PSD were H+ ions with different kinetic energies. Low kinetic energy H+ ions were detected only from the HF rinsed surfaces presumably arising from scission of Si—H bonds while higher kinetic energy ions attributed to adsorbed hydrocarbon dissociation were observed for all of the surfaces.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352224
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  • 6
    Electronic Resource
    Electronic Resource
    Auger photoelectron coincidence spectroscopy using synchrotron radiation (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3013-3026 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The technique of Auger photoelectron coincidence spectroscopy (APECS) using synchrotron radiation is discussed. Technical considerations and experimental details are emphasized. Results from Cu(100), Ta(100), and Al(111) are presented to show the kinds of new information that APECS can provide.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142602
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  • 7
    Electronic Resource
    Electronic Resource
    In situ reactive glow discharge cleaning of x-ray optical surfaces (1987)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 58 (1987), S. 1042-1045 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report the first implementation of an in situ glow discharge cleaning procedure for the removal of carbon contamination from x-ray optical surfaces. In situ cleaning obviates the need for the time-consuming and costly process of element removal, cleaning or repolishing, remounting, and realignment usually necessary to restore x-ray optics to their original condition. The apparatus required is quite simple and can easily be fitted to most existing UHV (ultrahigh vacuum) mirror boxes or monochromators. Results with several monochromators at the Brookhaven National Labs National Synchrotron Light Source (NSLS) show that better than original performance can be obtained at the carbon K edge, since the elements are not exposed to atmosphere after in situ cleaning and do not accumulate the adventitious carbon layer associated with more traditional methods. Possible improvements and extensions of the technique are also described.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139605
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  • 8
    Electronic Resource
    Electronic Resource
    Compact high flux photon beam position monitor : International conference on synchrotron radiation instrumentation (SRI−88) (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1947-1950 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a new compact water-cooled beam position monitor for use at the NSLS X-13 Insertion Device Development beamline, currently fitted with a high-power, high-brightness soft-x-ray undulator. We describe the novel geometry of the monitor and present the results of tests which explore its sensitivity, stability, and linearity. These results were obtained on the NSLS Beamline Research and Development white light beamline, U14B, on the VUV ring and suggest that beam position monitors of this type might be adapted to other facilities with similar spectral characteristics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140896
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  • 9
    Electronic Resource
    Electronic Resource
    Non-neutralizing monoclonal antibodies can prevent lethal alphavirus encephalitis (1982)
    [s.l.] : Nature Publishing Group
    Nature 297 (1982), S. 70-72 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] Sindbis virus, the prototype of the alphaviruses, contains two distinct envelope glycoproteins, El and E2, which exist as a complex, and a nucleocapsid protein, NC. It has been shown that antibodies raised in rabbits against each of the individually isolated and purified glycoproteins of SV possess ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/297070a0
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  • 10
    Electronic Resource
    Electronic Resource
    Isolation of Rhamnose Derivatives from Ulva lactuca (1941)
    [s.l.] : Nature Publishing Group
    Nature 147 (1941), S. 390-390 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] WORKING on algæ other than the Chlorophyceæ, various investigators have established the existence of algal polysaccharides containing mannuronic, galactose or fucose residues, the two latter being in the form of sulphuric acid esters. An investigation of Ulva lactuca, a member of the ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/147390a0
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