Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
63 (1992), S. 5649-5652
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
In quite a few cases, the geometric distortion of a scanning tunneling microscope (STM) image is essentially caused by the nonorthogonal scanning. A physical and mathematical model is proposed to correct such distortion, giving a satisfactory result.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143395
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