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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1575-1579 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Medium energy (100–300 keV) time-of-flight spectrometry for surface analysis uses the correlated detection of an energetic ion and the secondary electrons emitted as it passes through a carbon foil. When microchannel plates are employed in this detection scheme, a typical mean efficiency of detection of less than 30% is achieved. When instead a surface barrier detector is used to detect the ion, providing simultaneous acquisition of velocity and energy information, certain advantages are realized over the two microchannel plate configuration in the characterization of low level constituents of surfaces. Specifically, energy-discriminated gating of the start pulse was observed to nearly eliminate count rate dependent background in a time-of-flight spectrum. Further reduction in background was obtained by the selective elimination of forward recoil species or backscatters from the substrate. Replacement of the stop microchannel plate by a surface barrier detector has resulted in improved detection efficiency for He, as well as provided a means for further study of the processes which affect time-of-flight spectrometer response, including multiple scattering and secondary electron emission in the start foil. In this publication, we describe the application of this particle telescope to the backscattering analysis of gold on silicon and the forward scattering measurement of hydrogen in a self-supporting carbon film.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 3580-3586 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An accurate algorithm is described for the computation of the theoretical values of the linear four-point probe thickness correction factors for point injection of current and insulating and conducting substrates. Three expressions are presented for the insulating substrate case that yield maximum fractional errors of 0.03%, 10−6, and 10−16, respectively. Additional expressions are presented for the case of a film on a conducting substrate and a critical comparison of the two cases is made. The theoretical basis of the algorithms, a Euler–Maclaurin expansion, is described. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 1712-1714 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnesium fluoride coatings ∼170 A(ring) thick have been evaporated onto mirror-quality Be substrates in ultrahigh vacuum and subsequently subjected to 250 keV α particle irradiation at room temperature. Analysis of the irradiated area by medium energy backscattering spectrometry revealed that the irradiation selectively removed fluorine with an initial yield of 2.2 fluorine atoms per incident α particle. A visible degradation in reflectivity, which became progressively more extensive with increasing dose, was observed after an α particle fluence of 1016 cm−2. After a total irradiation of 4×1017 cm−2 less than 20% of the fluorine in the film remained, effectively reducing it to metallic magnesium. The effect of this change on the reflectivity of the surface was catastrophic.
    Type of Medium: Electronic Resource
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  • 4
    Publication Date: 2015-08-13
    Description: Using a combination of continuous wave and time-resolved spectroscopy, we study the effects of interfacial conditions on the radiative lifetimes and photoluminescence intensities of sub-monolayer colloidal CdTe/CdS quantum dots (QDs) embedded in a three-dimensional porous silicon (PSi) scaffold. The PSi matrix was thermally oxidized under different conditions to change the interfacial oxide thickness. QDs embedded in a PSi matrix with ∼0.4 nm of interfacial oxide exhibited reduced photoluminescence intensity and nearly five times shorter radiative lifetimes (∼16 ns) compared to QDs immobilized within completely oxidized, porous silica (PSiO 2 ) frameworks (∼78 ns). The exponential dependence of QD lifetime on interfacial oxide thickness in the PSi scaffolds suggests charge transfer plays an important role in the exciton dynamics.
    Print ISSN: 0003-6951
    Electronic ISSN: 1077-3118
    Topics: Physics
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