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  • 1
    Electronic Resource
    Electronic Resource
    External electro-optic measurement utilizing poled polymer-based asymmetric Fabry–Perot reflection film (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 6184-6188 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An external linear electro-optic measuring system based on a poled polymer asymmetric Fabry–Perot multiple reflection film has been built, and the electric signals propagating on an indium tin oxide coplanar strip transmission line have been successfully measured. The nonlinear polymer spin coated on the high-reflectivity glass substrate was corona poled, thus an asymmetric Fabry–Perot film was fabricated based on polymer reflectivity and high reflectivity glass. The film standing-free technique and reflective configuration were adopted in this system. The principle of the system was analyzed by multiple reflection and index ellipsoid methods. The voltage sensitivity about 5 mv/Hz was obtained as 1 kHz sine input electric signals propagating on coplanar electrodes. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371672
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    2-picosecond, GaAs photodiode optoelectronic circuit for optical correlation applications (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 3104-3106 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An ultrafast GaAs Schottky photodiode is monolithically integrated with a microwave detector. By using this new optoelectronic circuit in place of a nonlinear crystal in an optical correlation setup, the high-speed photodiode can measure laser pulse durations without using expensive sampling oscilloscopes. Key advantages are that this circuit works over a broad wavelength range and at low peak optical powers. The correlated temporal response of the circuit is measured to be 1.9 ps full width at half maximum. Due to its wavelength flexibility, cross correlation with different lasers may be performed with this single device.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107975
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  • 3
    Electronic Resource
    Electronic Resource
    Tapping mode atomic force microscopy using electrostatic force modulation (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 2831-2833 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a simple tapping mode in atomic force microscopy using a capacitive electrostatic force. In this technique, the probe-to-sample distance is modulated by the capacitive force between tip and sample induced by a sinusoidal bias applied to the conductive probe instead of a conventional mechanical vibration. The electrostatic force versus distance curve of the probe indicates that it is necessary to use a rather stiff cantilever to prevent the snapping of the tip into the surface due to the adhesive force at the surface. We have succeeded in obtaining topographic images of a conductive surface as well as a soft polystyrene sample with a low tracking and lateral force through this method. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117333
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