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  • 1
    Electronic Resource
    Electronic Resource
    Dispersion of surface plasmons in rectangular, sinusoidal, and incoherent silver gratings (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 1577-1581 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dispersion behavior of surface plasmons on silver gratings in the center of the first Brillouin zone is determined by measurements of the reflected light as a function of amplitude and of the profile of the gratings. We studied the dispersion relation of sinusoidal gratings, rectangular gratings, and incoherent gratings. We found a strict relationship between the profile of the grating and the dispersion relation of the surface plasmons. Our experiments showed at small amplitudes a crossing of the dispersion branches without a gap. For higher amplitudes a frequency or a momentum gap occurred depending on whether the profile had higher Fourier components or not. The experimental results are in accordance with numerical simulations.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356394
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  • 2
    Electronic Resource
    Electronic Resource
    Experimental comparison of a helium electron polarimeter with a calibrated high-precision Mott detector (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4885-4893 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Comparative electron polarization measurement with a helium electron polarimeter and a high-precision Mott detector are presented. For these measurements the helium electron polarimeter was calibrated according to theory, whereas the Mott detector was calibrated independently with an improved auxiliary-target method. The comparison of the experimental results reveals various problems inherent in helium electron polarimetry, such as poor efficiency and problems occurring in precise light polarization measurements. At present, a high-precision Mott detector is therefore clearly superior to a helium polarimeter with respect to efficiency and accuracy. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146170
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  • 3
    Electronic Resource
    Electronic Resource
    Illumination-dependent dynamic resistance of Hg1−xCdxTe heterojunction photodiodes (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 5705-5712 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Experimental data are presented on the illumination dependence of the dynamic resistance of long-wave infrared heterojunction photodiodes and the results are interpreted using a numerical drift/diffusion device model. The diodes are double-layer heterojunctions grown by liquid-phase epitaxy; nominal cutoff wavelength, zero-bias quantum efficiency, and resistance area product are 10.6 μm, 76%, and 210 Ω cm2 (77 K), respectively. It is shown that for a single-sided p-on-n heterojunction, the illumination dependence is due to an increase in hole current resulting from a voltage-dependent increase in the base layer diffusion current. Calculated results are provided as a function of relative hetero- and p-n junction location and applied reverse bias. The results are compared with experimental data obtained on back-illuminated HgCdTe heterojunction diodes. An interpretation based upon the voltage dependence of the hole concentration at the depletion edge is presented and contrasted with recent models appearing in the literature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354186
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  • 4
    Electronic Resource
    Electronic Resource
    Calibration of a Mott electron polarimeter: Comparison of different methods (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 952-957 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The accuracy of the calibration of a Mott polarimeter with a recently suggested method that uses an auxiliary target is compared with the accuracy obtained with the classical double-scattering experiment in its improved form. It turns out that the former method is affected by depolarization of the polarized incident beam in the auxiliary target. This systematic error source can, however, be eliminated by performing an additional asymmetry measurement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144148
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  • 5
    Electronic Resource
    Electronic Resource
    Primary and secondary stability analysis of a three-dimensional boundary-layer flow (1991)
    New York, NY : American Institute of Physics (AIP)
    Physics of Fluids 3 (1991), S. 2378-2391 
    Details
    ISSN: 1089-7666
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A three-dimensional, incompressible boundary-layer flow is investigated theoretically with respect to primary and secondary instability. These investigations accompany a basic transition experiment, which is being performed at the DLR in Göttingen [B. Müller, in Laminar-Turbulent Transition, edited by D. Arnal and R. Michel (Springer-Verlag, Berlin, 1990), p. 489]. Primary stationary and secondary nonstationary disturbances are used to model the mean flow and the fluctuations of a measured (quasi-) saturation state. The analysis is based on a Falkner–Skan–Cooke approximation of the undisturbed flow. Good agreement of the secondary stability model with this experiment is obtained, especially concerning the spatial distribution of the rms fluctuation. A striking change of the vortex pattern due to secondary instability has not been observed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.858218
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  • 6
    Electronic Resource
    Electronic Resource
    Effect of the barrier thickness on interface defect density in amorphous-Si:H/amorphous-Si1−xCx:H multilayers (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 2798-2800 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The constant photocurrent spectra (CPM) have been measured in a series of undoped a-Si:H/a-Si1−xCx:H multilayers with different thickness (db) of the a-Si1−xCx:H barrier layers from 5 to 100 A(ring). It is found that the apparent defect absorption and the apparent Urbach energy in the CPM spectra increase monotonically with db. These results show that the interface properties are strongly affected by the barrier layer thickness. The interface defect density, as evaluated from the CPM spectra, increases from 5×109 to 9×1011 cm−2 with db. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112569
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