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  • 1
    Electronic Resource
    Electronic Resource
    Development of a hard x-ray imaging microscope : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2287-2289 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A hard x-ray imaging microscope based on a phase zone plate has been developed and tested. The zone plate, with a 5 cm focal length and a 0.2 μm smallest linewidth, was used to image 8 keV x rays from the samples. The imaging microscope can be used to obtain nearly diffraction-limited resolution over the entire imaging field, and its resolution is almost independent of source size and source motions. We have tested such an imaging microscope, and a resolution of about 0.4 μm was obtained. The images were obtained with an exposure time of less than 1 min, for a magnification factor of 30 in the x rays. The x rays were then converted into visible light, and another 7 times magnification were obtained by using a lens system coupled to a charge coupled device camera. The results from the imaging microscope, and possible applications, will be discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145666
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  • 2
    Electronic Resource
    Electronic Resource
    Evolution of microstructure in nanocrystalline Mo-Cu thin films during thermal annealing (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 2435-2440 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The evolution of microstructure in Mo-Cu thin films during annealing has been investigated by in situ sheet resistance measurements, ex situ x-ray diffraction, and in situ hot-stage as well as conventional transmission electron microscopy. Mo-Cu thin films, deposited on various glass substrates by magnetron sputtering at ∼30 °C, were supersaturated solid solutions of Cu in Mo with a nanocrystalline microstructure. The as-deposited films had large compressive residual stresses owing to the low homologous deposition temperature and low Ar pressure during deposition. Annealing results showed two distinct sets of microstructural changes occurring in the temperature ranges between ∼300 and 500 °C, and ∼525 and 810 °C. In the lower-temperature range, anisotropic growth of nanocrystallites was accompanied by stress relaxation without any observable phase separation. At temperatures greater than ∼525 °C, the metastable solid solution collapsed and Cu precipitated at the grain boundaries. Increasing temperature resulted in the coarsening of Cu precipitates and simultaneous growth of Mo grains. At temperatures greater than ∼700 °C, phase separation and grain growth approached completion. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360756
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  • 3
    Electronic Resource
    Electronic Resource
    GaAs to InP wafer fusion (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4227-4237 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This paper presents an analysis of the various properties of the fused interface between GaAs and InP. Interface dislocations are characterized by transmission electron microscopy. Bipolar electrical properties are studied by electron beam induced current measurements and by electrical measurements of fused diode and laser structures. Absorptive optical losses at the interface are estimated from measurements on fused Fabry–Perot resonators and optical scattering losses from interface roughness are estimated by atomic force microscopy. Finally a preliminary mechanical analysis of fracture patterns of fused mesas is presented. The results from our analysis are used to develop guidelines for the fabrication of fused optoelectronic devices. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359884
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  • 4
    Electronic Resource
    Electronic Resource
    X13A: A versatile soft x-ray undulator beamline : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1827-1829 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The undulator based beamline X13A at the National Synchrotron Light Source has been commissioned recently. The X13 undulator has an 8 cm period, and its first harmonic is in the energy range of 200–700 eV at the nominal ring energy of 2.5 GeV. The beamline uses horizontally deflecting optics. It consists of a SiC plane mirror, a water cooled entrance slit, a spherical grating, and two fixed exit slits. A flux of more than 1012 photons/s at 450 eV has been measured at X13A with an aluminum-oxide photodiode with a 200 μm entrance slit, a 500 μm exit slit, and a ring current of 242 mA. A VF3 absorption spectrum recorded at X13A shows the monochromator resolving power is at least 1000 at ∼500 eV with 30 μm entrance and exit slits, in agreement with calculations. The X13A beamline will be used for x-ray coherence studies, spectroscopy, and multilayer reflectivity measurements as well as for x-ray instrumentation diagnostics. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146461
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  • 5
    Electronic Resource
    Electronic Resource
    An intensity interferometer for soft x rays : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2281-2283 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We designed and built an intensity interferometer to characterize the spatial coherence of a soft x-ray undulator beam. The beam source size and shape can be determined from the measured coherence function. The instrument is 400 mm long and is mounted on a standard 204-mm diameter flange. This compact design is readily adaptable to other beamlines with sources of sufficient spectral brightness. Details of the interferometer design and performance are presented. We anticipate that when this technique is mature, it will provide a useful diagnostic for high brightness x-ray beams. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145664
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  • 6
    Electronic Resource
    Electronic Resource
    PdGeTiPt Ohmic contacts to p+-AlxGa1−xAs (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 273-275 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ohmic contacts to heavily C-doped AlGaAs were made using PdGeTiPt that had specific contact resistances Rc, as low as 1.7×10−6 Ω cm2 when annealed at 600 °C. The less heavily doped samples annealed at temperatures between 350 and 500 °C were non-Ohmic, and Rc decreased with increasing annealing temperature between 500 and 600 °C. For the more heavily doped samples, Rc decreased with increasing annealing temperature. Rc increased for all samples at annealing temperatures above 600 °C. Rc rose quickly by 102 when the samples were reannealed at 300 °C for 20 h, but remained unchanged with further reannealing for up to 100 h. This behavior is consistent with partial compensation generated by the rapid out-diffusion of Ga at low annealing temperatures and the subsequent in-diffusion of Ge into the Ga vacancies left behind. The lower Rc obtained with the 600 °C anneal can be explained by an increased As out-diffusion and the subsequent in-diffusion of Ge into the As vacancies at the higher annealing temperatures. Interfacial reactions and elemental diffusion of the contacts investigated via transmission electron microscopy and elemental depth profiles obtained by Auger electron spectroscopy are also consistent with this mode. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.114780
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  • 7
    Electronic Resource
    Electronic Resource
    Colloid Chemical Characterization of the Photosurfactant 4-Ethylazobenzene 4'-(Oxyethyl)trimethylammonium Bromide (1995)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 99 (1995), S. 8799-8803 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j100021a054
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  • 8
    Electronic Resource
    Electronic Resource
    A New Eudesmenoic Acid from Artemisia phaeolepis (1995)
    s.l. : American Chemical Society
    Journal of natural products 58 (1995), S. 288-290 
    Details
    ISSN: 1520-6025
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/np50116a023
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  • 9
    Electronic Resource
    Electronic Resource
    Immunohistochemical demonstration of bone morphogenetic protein in odontogenic tumors (1997)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of oral pathology & medicine 26 (1997), S. 0 
    Details
    ISSN: 1600-0714
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: The aim of the present study was to describe the expression and distribution of bone morphogenetic protein (BMP) in odontogenic tumors by immunohistochemistry using monoclonal antibody against bovine BMP (BMPMcAb). Eight types of odontogenic tumors (44 cases), including ameloblastoma (20 cases), cementifying fibroma (8 cases), benign cementoblastoma (5 cases), dentinoma (3 cases), compound odontoma (2 cases), adenomatoid odontogenic tumor (2 cases), calcifying epithelial odontogenic tumor (2 cases) and odontogenic fibroma (2 cases), were studied. The results showed that, according to the immunostaining pattern of BMPMcAb, tumors could be classified into two types: all cementifying fibro-mas, benign cementoblastomas. Dentinomas, odontogenic fibromas. and compound odontomas demonstrated a positive reaction, whereas all ameloblastomas, adenomatoid odontogenic tumors, and calcifying epithelial odontogenic tumors were negative. BMPMcAb-positive odontogenic tumors were those tumors with formation of enamel, dentin, cementum or bone. Therefore. BMP might play an important role in the formation of calcified dental tissues and the development of odontogenic tumors contaning such tissues.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1600-0714.1997.tb01236.x
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  • 10
    Electronic Resource
    Electronic Resource
    Preliminary assessment of the epithelial nuclear-cytoplasmic ratio and nuclear volume density in human palatal lesions (1995)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of oral pathology & medicine 24 (1995), S. 0 
    Details
    ISSN: 1600-0714
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: We have analysed both the nuclear-cytoplasmic (N/C) ratio and nuclear volume densities (VVN) in defined strata from human hard palate lesions with and without malignant potential to determine the prognostic reliability and/or validity of this parameter. Measurements of cellular and nuclear areas of basal and spinous cells from normal (N) and pathological palatal epithelium were made on histological sections using an image analyser. The lesions comprised fibrous hyperplasia (FH), traumatic inflammation (INF), benign hyperkeratosis (HK), squamous cell papilloma (PP), dysplastic epithelium adjacent to invasive carcinoma (CE) and islands of invasive squamous cell carcinoma (CI). In basal cells, no significant differences were detected in comparisons of N/C and VVN between all pathological groups and the N control group. The mean value for CE was lower than that obtained for N. In spinous cells, the only statistically significant comparison was between IF and FH for both N/C and VVN. Both parameters were lower in CE than in N. Of all groups analysed except CI, the CE group is the only one likely to possess an increased malignant potential. The N/C ratio therefore seems to be of no value as a predictor of malignancy in palatal epithelial lesions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1600-0714.1995.tb01179.x
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