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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 536-538 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Having been exposed to hydrogen plasma, Te-doped GaAs wafers were deposited with metal Ti, to form Ti/n-GaAs Schottky barrier diodes (SBD). It was found that due to hydrogenation the Schottky barrier height (SBH) of the SBD decreases from 0.76 to 0.58 eV and the effective Richardson constant A** decreases from 11 to 0.03 A/cm2/K2. Annealing the hydrogenated SBD at different reverse biases at 100 °C produces SBHs that have a one-to-one correlation with the biases of reverse-bias annealing (RBA), i.e., the SBH can be controlled, within the range 0.58–0.74 eV, by the bias of RBA. When the reverse bias is equal to or larger than 3 V, the SBH and the effective Richardson constant of the hydrogenated SBDs after RBA are very near to those of SBDs without hydrogenation. This means that a RBA with a bias higher than a critical value, 3 V in our case, can remove the effects of hydrogenation, but if the SBD is annealed again without a bias at 100 °C for 1 h or more, its SBH and effective Richardson constant recover their hydrogenated values. The main experimental facts can be explained qualitatively by a simple theoretical model.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 30 (1992), S. 687-691 
    ISSN: 0887-6266
    Keywords: poly(ethylene terephthalate), amorphous, planar deformation of ; deformation of PET by stretching and forging ; drawing techniques and deformation of PET ; crystallization in drawn PET ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: The planar deformation of amorphous poly(ethylene terephthalate) (PET) was performed by stretching and by forging under comparable conditions at a series of constant temperatures, 80, 90, 100, and 110°C. The highest planar draw ratios of 4.5 × 4.5 and 3.5 × 3.5 were obtained by forging and stretching, respectively. Samples were studied before and after deformation by wide angle x-ray scattering (WAXS), differential scanning calorimetry (DSC), density measurements, and elastic recovery at 100°C. A distinct difference in efficiency of draw between these two techniques is found, as judged mainly by the straininduced crystallization. The forging is more effective than stretching in achieving stabilized planar draw under comparable process conditions.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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