Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
18 (1989), S. 157-164
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
An absolute quantitative analytical method without external standards has been developed for thick sample analysis by XRF and PIXE and has been applied to bronze and brass alloys. Comparisons between the results obtained and the chemical results were made and the detection limits for the determined elements were evaluated. In an Appendix a rapid calculation of the efficiency of the Ge(Hp) detector is presented.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300180406
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