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    Electronic Resource
    Electronic Resource
    Westerville, Ohio : American Ceramics Society
    Journal of the American Ceramic Society 83 (2000), S. 0 
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: An in situ-toughened silicon carbide (ABC-SiC) has been examined in the as-processed condition, where the grain-boundary films are predominantly amorphous, and following thermal exposure at a temperature of 1300°C, where the films become fully crystalline. Previous work has shown that, at elevated temperatures (up to 1300°C), after the grain-boundary films crystallize in situ, only a marginal reduction in strength, fracture toughness, and cyclic-fatigue crack-growth properties is observed, in comparison with those of the as-processed microstructure at 25°C. In the present study, the effect of such crystallization on the subsequent strength, toughness, and fatigue properties at 25°C is examined. Little or no degradation is observed in the room-temperature properties with the crystallized grain-boundary films/phase; in fact, although the strength shows a small reduction (∼3%), the fracture toughness and fatigue-crack-growth threshold both increase by ∼20%, compared with that of the as-processed structure with amorphous grain-boundary films.
    Type of Medium: Electronic Resource
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