ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The optical constants of seven CVD-SiC mirrors produced by different processes and a sintered SiC mirror have been measured in the soft x-ray region by means of the reflectance method. Although they are different in the crystal structure, the optical constants of the CVD-SiC mirrors are almost independent of the samples over the measured 200–1000 eV range. But the optical constants of the sintered SiC differ from those of the CVD-SiC mirrors over the measured range of 60–1000 eV. The photon-energy dependence of the optical constants of CVD-SiC is represented in terms of power formulas above 300 eV.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1140868