ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The performance of the Siemens CCD detectors with 1K and 2K chips is evaluated using radiation from bending magnet beamlines at SSRL and NSLS and from a rotating anode source with three types of optics. Structure solution quality data are obtainable in short times for macromolecular (up to 300 A(ring) cell) and small molecule crystallography. General experiments, such as time-resolved powder diffraction and overlayer diffraction are also possible. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147504