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Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy (1999)

Müller, A.-D. ; Müller, F. ; Hietschold, M.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 70 (1999), S. 3970-3972

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Shape and composition of electrochemically etched tungsten tips for use in scanning tunneling microscopy (STM) were investigated in a transmission electron microscope (TEM) with a Gathan imaging filter (GIP). The tips are prepared by a lamella drop-off technique. We observe typical tip radii of less than 10 nm. After a storage of some days under ambient conditions, an amorphous oxide film is detectable. The electron energy-loss spectroscopy confirms that the surface is contaminated by compounds that contain carbon, too. © 1999 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1150022

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