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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 3220-3222 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple and reproducible method for the fabrication of high-Tc Josephson junctions and SQUIDs is presented. A very weak disturbance is produced by pressing a diamond needle onto the substrate surface before film deposition. The junction parameters such as the critical current Ic, the IcRn product, or β=2IcL/Φ0 (with L the self-inductance of the SQUID loop) are accessible by controlling the film thickness and can be varied by several orders of magnitude. The junctions usually have critical current densities jc in the range of 5×104–1×105 A/cm2 at 77 K and show Shapiro steps when exposed to rf power. The current-voltage characteristics are resistively shunted junctionlike and nonhysteretic. In dc SQUIDs a maximum peak-to-peak voltage response to dc flux of up to 12 μV at 77 K is observed.
    Type of Medium: Electronic Resource
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