Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
56 (1990), S. 728-730
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Polycrystalline Pd and amorphous PdTa films on Al substrates were studied by a variable energy positron beam and by Rutherford backscattering. Since positron diffusion in the overlayers is limited, the range follows directly from the Doppler broadening as a function of incident positron energy. To observe possible effects of positron backscattering, a sandwich of Al/Pd/Al was studied as well. It was found that the mean penetration depth is not described well by z¯(E)=A(μg/cm2)×En(E), if A and n are assumed to be material and energy independent.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.102694
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