ISSN:
1432-0630
Keywords:
Surface physics
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Abstract In this work an experiment is described which allows in situ comparison of SIMS (Secondary Ion Mass Spectrometry) and ISS (Ion Scattering Spectrometry). Measurements on Cu and stainless stell surfaces show that in some respects qualitative agreement between both methods exists. In both cases quantitative surface composition analysis is hampered by the lack of knowledge of secondary ion yields. Especially in case of SIMS the adsorbed species like oxygen have a great influence on the ion yield.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00884235
