Publication Date:
2014-04-01
Description:
Author(s): D. Benzeggouta, Kh. Khazen, I. Vickridge, H. J. von Bardeleben, L. Chen, X. Z. Yu, and J. H. Zhao The Mn dopant distribution in ultrathin (20 nm) highly doped (nominal x = 0.20) Ga1−xMnxAs epitaxial films with critical temperatures close to 175 K and magnetization of 100 emu/cm3 is analyzed by Rutherford backscattering spectrometry (RBS) in a random and channeling configuration. We could quantif... [Phys. Rev. B 89, 115323] Published Mon Mar 31, 2014
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics