Publication Date:
2014-02-27
Description:
Author(s): D. L. Cortie, J. D. Brown, S. Brück, T. Saerbeck, J. P. Evans, H. Fritzsche, X. L. Wang, J. E. Downes, and F. Klose Polarized neutron reflectometry and x-ray reflectometry were used to determine the nanoscale magnetic and chemical depth profiles of the heavy rare-earth nitrides HoN, ErN, and DyN in the form of 15- to 40-nm-thick films. The net ferromagnetic components are much lower than the predictions of densit... [Phys. Rev. B 89, 064424] Published Wed Feb 26, 2014
Keywords:
Magnetism
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics