In:
ECS Transactions, The Electrochemical Society, Vol. 50, No. 2 ( 2013-03-15), p. 1759-1767
Abstract:
Oxidation states of tantalum that is contained in oxygen-reduction-reaction (ORR) active Ta-CNO catalysts were investigated by hard x-ray photoelectron spectroscopy (HAXPES) to clarify the nature of the active sites of Ta-CNO ORR catalysts. The results of HAXPES measurements showed that both Ta 3d and Ta 4f core levels shifted to the low energy, suggesting that oxygen vacancies were introduced in surface oxide phases of ORR active Ta-CNOs. This result is consistent with previous x-ray absorption spectroscopic studies. We also developed the electrochemical (EC)-XPS and EC-HAXPES techniques to analyze the reaction mechanism of ORR on Ta-CNOs. We demonstrate that EC-XPS and EC-HAXPES are a suitable probe to observe electrochemical reactions at electrode surfaces through an example of observation of the electrochemical oxidation behaviors of Ta-CNO catalysts.
Type of Medium:
Online Resource
ISSN:
1938-5862
,
1938-6737
DOI:
10.1149/05002.1759ecst
Language:
Unknown
Publisher:
The Electrochemical Society
Publication Date:
2013
detail.hit.zdb_id:
2217591-X
detail.hit.zdb_id:
2251888-5