In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 50, No. 2R ( 2011-02-01), p. 020210-
Abstract:
Reliability of both high-speed vertical-cavity surface-emitting lasers (VCSELs) with silicone-encapsulated structure and the parallel optical transmitter modules were investigated. Results of wear-out life tests indicated that the VCSEL with a silicone-encapsulated structure has the same lifetime as a bare-chip VCSEL, which was more than 10 6 h at the junction temperature of 90 °C. High reliability of the 20 Gbps × 12 channel on-board parallel optical transmitter modules in various test environments was also confirmed.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.50.020210
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
2011
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7