In:
Japanese Journal of Applied Physics, IOP Publishing, Vol. 33, No. 5R ( 1994-05-01), p. 2534-
Abstract:
Flux lines in a Nb thin film at 4.5 K were observed by using a 300-kV field-emission transmission electron microscope equipped with a TV system. When the magnetic field applied to the film was suddenly changed, flux lines moved until arriving at an equilibrium state by hopping from one pinning center to another. Frame-by-frame observation of videotape recorded with a time resolution of 1/30 s revealed how individual flux lines behaved when they came across subgrain boundaries, and interacted with the boundaries.
Type of Medium:
Online Resource
ISSN:
0021-4922
,
1347-4065
DOI:
10.1143/JJAP.33.2534
Language:
Unknown
Publisher:
IOP Publishing
Publication Date:
1994
detail.hit.zdb_id:
218223-3
detail.hit.zdb_id:
797294-5
detail.hit.zdb_id:
2006801-3
detail.hit.zdb_id:
797295-7