In:
Science, American Association for the Advancement of Science (AAAS), Vol. 303, No. 5664 ( 2004-03-12), p. 1652-1656
Abstract:
Ultrathin Al 2 O 3 layers on alloys are used as templates for model catalysts, tunneling barriers in electronic devices, or corrosion-resistant layers. The complex atomic structure of well-ordered alumina overlayers on NiAl(110) was solved by surface x-ray diffraction. The oxide layer is composed of a double layer of strongly distorted hexagonal oxygen ions that hosts aluminum ions on both octahedral and tetrahedral sites with equal probability. The alumina overlayer exhibits a domain structure that can be related to characteristic growth defects and is generated during the growth of a hexagonally ordered overlayer (Al 2 O 3 ) on a body-centered cubic (110) substrate (NiAl).
Type of Medium:
Online Resource
ISSN:
0036-8075
,
1095-9203
DOI:
10.1126/science.1094060
Language:
English
Publisher:
American Association for the Advancement of Science (AAAS)
Publication Date:
2004
detail.hit.zdb_id:
128410-1
detail.hit.zdb_id:
2066996-3
detail.hit.zdb_id:
2060783-0
SSG:
11
