In:
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 55, No. 1 ( 2008), p. 233-240
Type of Medium:
Online Resource
ISSN:
0018-9499
DOI:
10.1109/TNS.2007.914035
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2008
detail.hit.zdb_id:
218510-6