In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 19, No. 2 ( 2019-6), p. 433-436
Type of Medium:
Online Resource
ISSN:
1530-4388
,
1558-2574
DOI:
10.1109/TDMR.2019.2915807
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2019
detail.hit.zdb_id:
2057871-4
detail.hit.zdb_id:
2061445-7