In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 12, No. 2 ( 2012-06), p. 209-216
Type of Medium:
Online Resource
ISSN:
1530-4388
,
1558-2574
DOI:
10.1109/TDMR.2012.2195005
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2012
detail.hit.zdb_id:
2061445-7