In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 8, No. 3 ( 2008-09), p. 565-570
Type of Medium:
Online Resource
ISSN:
1530-4388
DOI:
10.1109/TDMR.2008.2002356
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2008
detail.hit.zdb_id:
2061445-7