In:
AIP Advances, AIP Publishing, Vol. 8, No. 10 ( 2018-10-01)
Abstract:
Injection-charge extraction by linearly increasing voltage in metal-insulator-semiconductor structures (MIS-CELIV) is applied for the hole mobility measurement of N,N’-Bis(naphthalen-1-yl)-N,N’-bis(phenyl)-benzidine (NPB), which is a standard hole-transporting material for organic light-emitting diodes. Ideal transient currents in agreement with the theory are observed in the NPB film due to its amorphous and homogenous structure, which is regarded as a continuous dielectric. This ideal response enables us to discuss the validity of the MIS-CELIV mobility by comparing its absolute value with that of the conventional space-charge-limited current method. In addition, to establish an experimental guideline for precise measurements, the effect of the voltage drop on the insulator is investigated.
Type of Medium:
Online Resource
ISSN:
2158-3226
Language:
English
Publisher:
AIP Publishing
Publication Date:
2018
detail.hit.zdb_id:
2583909-3