In:
Journal of Applied Physics, AIP Publishing, Vol. 75, No. 4 ( 1994-02-15), p. 2119-2124
Abstract:
High quality epitaxial Nd2−xCexCuO4−y (NCCO) thin films were fabricated on various substrates by pulsed-laser deposition using N2O reactive gas. The similarities and dissimilarities of the superconducting and structural properties of NCCO films, on perovskite-type substrates such as LaAlO3, NdGaO3, and SrTiO3 and on a fluorite-type substrate of yttria-stabilized zirconia (YSZ), were investigated systematically as a function of film thickness by transport measurements and structural analysis. A remarkable reduction of Tc was observed when the film was thinner than a critical thickness, which strongly depends on the substrate. The critical thicknesses for which Tc is 80% of Tc max are 1200, 1000, 600, and 450 Å for LaAlO3, NdGaO3, SrTiO3, and YSZ, respectively. YSZ turns out to be the best candidate for the growth of very thin NCCO films among the substrates studied. These results show a strong correlation between the strain and Tc in NCCO thin films and point the way to the fabrication of n-type superconducting electric field devices using ultrathin NCCO films.
Type of Medium:
Online Resource
ISSN:
0021-8979
,
1089-7550
Language:
English
Publisher:
AIP Publishing
Publication Date:
1994
detail.hit.zdb_id:
220641-9
detail.hit.zdb_id:
3112-4
detail.hit.zdb_id:
1476463-5
