In:
Applied Physics Letters, AIP Publishing, Vol. 91, No. 6 ( 2007-08-06)
Abstract:
The optical properties of thin-film layers are described by the complex index-of-refraction (N) and are commonly measured using spectroscopic ellipsometry. Once determined, they can be used to predict the optical reflection and transmission from films of any thickness. Fitting of the spectroscopic ellipsometry data for thin-film polymers and polymer-blends is difficult because numerous numerical assumptions are necessary and optical birefringence must be accounted for. Ellipsometric fitting techniques fail for thin films with strong absorption and high surface roughness. The authors present a simple method to measure N, perpendicular to the sample plane, of optically homogeneous films using a UV/Vis spectrometer and partial transmission substrates.
Type of Medium:
Online Resource
ISSN:
0003-6951
,
1077-3118
Language:
English
Publisher:
AIP Publishing
Publication Date:
2007
detail.hit.zdb_id:
211245-0
detail.hit.zdb_id:
1469436-0
