In:
SID Symposium Digest of Technical Papers, Wiley, Vol. 54, No. 1 ( 2023-06), p. 121-124
Abstract:
As display technology advances, display manufacturing processes
are getting complicated. Therefore, the origins of failures are not always from one process. Under the circumstances, applying the
conventional statistical methods to commonality analysis of multifaceted processes is difficult because the number of cases to
be considered is millions. Herein, we propose an effective method for interaction commonality analysis of display failures using
artificial intelligence, enabling to successfully achieve 90% detection performance.
Type of Medium:
Online Resource
ISSN:
0097-966X
,
2168-0159
Language:
English
Publisher:
Wiley
Publication Date:
2023
detail.hit.zdb_id:
2526337-7