In:
Chemistry – A European Journal, Wiley, Vol. 27, No. 17 ( 2021-03-22), p. 5312-5312
Abstract:
Invited for the cover of this issue is Jörg J. Schneider and co‐workers at Technical University Darmstadt, Helmholtz‐Zentrum Dresden‐Rossendorf and KIT Karlsruhe. The image depicts the application of high energy generated electron/positron couples which are able to detect defects sites in semiconducting zinc oxide thin films. Read the full text of the article at 10.1002/chem.202004270 .
Type of Medium:
Online Resource
ISSN:
0947-6539
,
1521-3765
DOI:
10.1002/chem.202005365
Language:
English
Publisher:
Wiley
Publication Date:
2021
detail.hit.zdb_id:
1478547-X