In:
Kahramanmaraş Sütçü İmam Üniversitesi Tarım ve Doğa Dergisi, KSU Journal of Agriculture and Nature, Vol. 24, No. 3 ( 2021-06-30), p. 586-593
Abstract:
Yellow rust disease commonly observed in wheat production causes serious grain yield losses. In this study, F4 plants obtained from crossing between bread wheat landrace B35 known as tolerant to stripe rust and cv. Seri 82 known as susceptible to stripe rust, and their parents were used. Genotypes were characterized with allele specific markers for gluten strength (Glu-B1), vernalisation (Vrn-A1), dwarfing (Rht8, tall Rht-B1a & Rht-D1a and short RhtB1b & Rht-D1b), high protein ratio (Gpc-B1), grain hardness, stripe rust (Yr51), stem rust (Sr49), rye translocation and waxy (Wx-A1) genes. Thirty-nine polymorphic bands were obtained from 16 DNA markers for wheat genotypes, the average allele number was determined as 2.4 and the average polymorphism information content (PIC) was calculated as 0.52. The highest allelic marker was VRN1AF (vernalisation) with 6 alleles and the lowest allelic markers were Sun104 (stem rust) and UHW89 (high protein ratio) with only one allele. Stripe rustYr51 (Sun104 marker) in Seri 82×B35-1 and 5 genotypes, stem rust Sr49 (Sun479) in Seri 82×B35-1, 2, 3, 4, 5 and 6 genotypes, (Sun209 marker) in Seri 82 and B35 genotypes, dwarfing genes Rht-B1b (BF-MR1 marker) in Seri 82×B35-1, 2, 3, 4, 5 and 6 genotypes, Rht-D1a (DF2-WR2 marker) in Seri 82×B35-2, 3, 4 and 6 genotypes, Rht8 (WMS261 marker) in Seri 82×B35-2, 3, 4 and 6 genotypes and rye translocation genes (NOR marker) in Seri 82×B35-2, 3 and 4 genotypes and (RIS marker) in Seri 82, B35, Seri 82×B35-1, 2, 3, 4, 5 and 6 genotypes were identified. A dendrogram created from DNA markers showed that Seri 82 and B35 genotypes were found 54% similar to F4 individuals, while Seri 82 × B35-3 and 4 genotypes were the most similar genotypes with 95%.
Type of Medium:
Online Resource
ISSN:
2619-9149
DOI:
10.18016/ksutarimdoga.vi.752972
Language:
Unknown
Publisher:
KSU Journal of Agriculture and Nature
Publication Date:
2021
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