Publication Date:
2017-12-31
Description:
Publication date: March 2018 Source: Vacuum, Volume 149 Author(s): Monisha Chakraborty, Sugata Bhattacharyya CdTe/ZnTe/CdTe thin film layers were vacuum-evaporated on glass-slides and annealed in box-furnace in the air. The samples were annealed at different temperatures of 350 °C , 400 °C and 450 °C , respectively. At each temperature, three sets of samples were annealed for one, two and 3 h, respectively. The films showed good inter-diffusion and high crystallinity even at a lower temperature of 350 °C . The 111(C) and 220(C) Cd 1-x Zn x Te planes showed an increasing left-hand shift in the 2θ axes, along with increasing annealing time and temperature. This trend is attributed to strain relaxation with increased annealing. Cd 1-x Zn x Te particle-size showed a sigmoid growth along with increasing temperature and time, while strain, dislocation-density, and the number of crystallites per unit area showed a sigmoid decay curve. At lower temperature, samples showed reduced bandgap due to charged defects and impurities like free Tellurium. At higher temperature bandgap increased, because of wire-like formation of TeO 2 and their probable substitutional incorporation into Cd 1-x Zn x Te lattice sites. The TeO 2 gradually formed into clusters. EDX results were finally co-related with the optical, structural and morphological results.
Print ISSN:
0042-207X
Electronic ISSN:
1879-2715
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
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