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Pis’ma Zh. Éksp. Teor. Fiz. 69, No. 8, 594–595 (25 April 1999)
The online version of the original article can be found at http://dx.doi.org/10.1134/1.567988
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Latyshev, Y.I., Kim, S.J. & Yamashita, T. Erratum: Experimental evidence for Coulomb charging effects in submicron Bi-2212 stacks [JETP Lett. 69, No. 1 84–90 (10 January 1999)]. Jetp Lett. 69, 640–643 (1999). https://doi.org/10.1134/1.567973
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DOI: https://doi.org/10.1134/1.567973