(Invited) MEMS Module Integration into SiGe BiCMOS Technology for Embedded System Applications

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© 2011 ECS - The Electrochemical Society
, , Citation Mehmet Kaynak et al 2011 ECS Trans. 41 191 DOI 10.1149/1.3633299

1938-5862/41/7/191

Abstract

Different MEMS process techniques have been integrated to 0.25 µm BiCMOS process for embedded system applications. Back-End-Off-Line (BEOL) integration technique was developed using standard metallization layers of BiCMOS process with additional MEMS process steps. As an example, an RF-MEMS capacitive switch was realized using BEOL embedded MEMS module. Back-side substrate etch method was developed as another MEMS integration technique. This technique is demonstrated by several high-Q passive components which can prevent from substrate losses and on-chip antennas/sensors for multi-GHz applications. Lastly, thick copper metallization with low-k BCB dielectric material was developed and processed on top of BiCMOS BEOL. It provides 2 additional thick copper metallization layers and allows realizing high-Q passives and on-chip THz resonators. Several design examples realized by using developed MEMS modules and processing techniques were also analyzed.

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10.1149/1.3633299