Abstract
THE light-profile microscope described by Tolansky1 is being applied in this laboratory to several fields, including the study of features of crystal growth2, the measurement of the thickness of thin film3 and evaluation of amplitudes of oscillation4. In this communication a brief description is given of a further application, whereby the radii of curvature of small spheres, droplets, cavities, etc., can be readily measured.
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References
Tolansky, S., Nature, 169, 445 (1952).
Tolansky, S., Zeitschrift für Elektrochemie, 56, 263 (1952).
Omar, M., and Rahbek, H., Nature, 169, 1008 (1952).
Tolansky, S., and Rahbek, H., Nature, 169, 1060 (1952).
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TOLANSKY, S., OMAR, M. Evaluation of Small Radii of Curvature using the Light-Profile Microscope. Nature 170, 758–759 (1952). https://doi.org/10.1038/170758b0
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DOI: https://doi.org/10.1038/170758b0
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